Zobrazeno 1 - 8
of 8
pro vyhledávání: '"S. M. Baumann"'
Autor:
Enrique J. Galvez, S. M. Baumann
Publikováno v:
SPIE Proceedings.
We present a study of composite vortices in light beams using component beams with no integral topological charge. We observed the same general features that are seen in when the component beams have an integral topological charge [E.J. Galvez, N. Sm
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f22a71a4ea77ade8afbab4b31d99915
https://doi.org/10.1117/12.764669
https://doi.org/10.1117/12.764669
Autor:
S. M. Baumann, Enrique J. Galvez
Publikováno v:
SPIE Proceedings.
We study the optical fields produced by non-integral binary forked gratings. We analyze experimentally the phase structure of the light beams by interference. We were able to identify individual optical vortices directly by observing the dislocations
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::364a8820472b79ac18f13b8fd7928b92
https://doi.org/10.1117/12.701638
https://doi.org/10.1117/12.701638
Autor:
James S. Harris, Darrell G. Schlom, Ivan Bozovic, James N. Eckstein, S. M. Baumann, K. E. von Dessonneck
Publikováno v:
Applied Physics Letters. 57:931-933
Atomic layering of high‐temperature superconducting compounds has been employed to grow films of Bi2Sr2Ca2Cu3Ox, in situ, on SrTiO3 substrates. Atomic monolayers of the constituent atoms were sequentially deposited by shuttering the fluxes from the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b0ae36079a078eda146787881eb4fbf2
https://doi.org/10.1063/1.104270
https://doi.org/10.1063/1.104270
Publikováno v:
MRS Proceedings. 337
WSix films are used extensively for contact, interconnect, and, in some cases, diffusion and Schottky barriers in semiconductor devices1. The electrical and barrier properties of these films are affected by a variety of factors, such as film stoichio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dbc9aecdee0239417fa18046879d2397
https://doi.org/10.1557/proc-337-675
https://doi.org/10.1557/proc-337-675
Autor:
K. H. Guenther, K. Balasubramanian, X.-Q. Hu, S. M. Baumann, M. Edgell, R. Chow, F. Rainer, C. Stolz
Publikováno v:
Optical Interference Coatings.
Reactive low voltage ion plating (RLVIP) produces dielectric thin films of excellent quality with dense, glassy microstructure and smooth surface, thus featuring low bulk and surface light scattering. The dense structure also prevents moisture penetr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8418d6e202ed1d6c72fab8a011b45293
https://doi.org/10.1364/oic.1992.othd13
https://doi.org/10.1364/oic.1992.othd13
Publikováno v:
Optics Express. 17:9818
We study the propagation of off-axis vortices in a paraxial beam formed by two collinear Laguerre-Gauss beams. We show that the vortices move about the beam axis as the light propagates resulting in a rotation of the beam's transverse profile. This r
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::102f76470918183e0ba0558bf3b15673
https://doi.org/10.1364/oe.17.009818
https://doi.org/10.1364/oe.17.009818
Publikováno v:
MRS Proceedings. 25
The reaction of a metal film with polycrystalline silicon to form a metal silicide has been shown to occur very rapidly when using cw lamp annealing in contrast to conventional furnace annealing. The faster reaction kinetics implies a more efficient
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::80eba972f2e1703ebef753dfce40bf40
https://doi.org/10.1557/proc-25-87
https://doi.org/10.1557/proc-25-87
Autor:
M. Kopnarski, D. A. Reed, P. Beckmann, C. A. Evans, H. Oechsner, G. Bachmann, S. D. Wilson, S. M. Baumann
Publikováno v:
Springer Series in Chemical Physics ISBN: 9783642827266
A variety of surface analytical techniques are in wide use today for the characterization of thin film systems, particularly in the semiconductor industry. Traditionally, the most popular technique for the characterization of thin film composition an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1642203c453cf561faafa3b473b41b31
https://doi.org/10.1007/978-3-642-82724-2_99
https://doi.org/10.1007/978-3-642-82724-2_99
