Zobrazeno 1 - 5
of 5
pro vyhledávání: '"S. M. Baraishuk"'
Autor:
I. A. Pavlovich, S. M. Baraishuk
Publikováno v:
Izvestiâ Vysših Učebnyh Zavedenij i Ènergetičeskih ob Edinennij SNG. Ènergetika, Vol 66, Iss 4, Pp 322-332 (2023)
This article discusses the factors that affect the electrical resistance of the current spreading of the grounding device. The issue of the electrophysical parameters of the soil that affect its resistivity and the consideration of such parameters in
Externí odkaz:
https://doaj.org/article/1bc8500987554e23ad12569f7da1a17c
Publikováno v:
Известия высших учебных заведений: Проблемы энергетики, Vol 23, Iss 1, Pp 80-92 (2021)
THE PURPOSE. The purpose of the article is to define the reasons to improve the system of grounding devices design. Author studies technical decisions that reduce grounding resistance values. Results are given researches how a mineral conductive mixt
Externí odkaz:
https://doaj.org/article/6314ba58bb9d42bc95d1161ea194d06d
Autor:
T. M. Tkachenko, Y. S. Yakovenko, V. F. Gremenok, M. Wiertel, Mieczysław Budzyński, S. M. Baraishuk, A. V. Stanchik, A. I. Turovets, S. A. Bashkirov
Publikováno v:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 12:1077-1081
Investigations into the influence of the substrate type (a glass substrate with a molybdenum sublayer, tantalum and molybdenum foils) on the surface morphology of Cu2ZnSnSe4 thin films obtained by selenization of electrochemically deposited and preli
Autor:
I. S. Tashlykov, S. M. Baraishuk
Publikováno v:
Russian Journal of Non-Ferrous Metals. 49:303-307
Elemental composition, roughness, and wettability of a graphite surface modified by ion-assisted deposition of a Cr coating ∼300–1000 nm thick are investigated using the methods of Rutherford backscattering, atomic force microscopy, and contact a
Publikováno v:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 2:310-316
The structure and phase composition of lightly-doped Al-Fe alloys obtained by ultrarapid quenching from the melt are investigated. The surface of foils was studied using scanning electron microscopy, atomic-force microscopy, and Rutherford backscatte