Zobrazeno 1 - 10
of 38
pro vyhledávání: '"S. Lindaas"'
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 347:431-435
The scanning transmission X-ray microscope on the X1A undulator beam line, at the National Synchrotron Light Source, has been used for imaging various biological as well as polymer samples at 55 nm Rayleigh resolution. The microscope is operated main
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fbd8e053c092d7ff7a8c405beda2c9a8
https://doi.org/10.1016/0168-9002(94)91922-4
https://doi.org/10.1016/0168-9002(94)91922-4
Autor:
David Sayre, Erik H. Anderson, Janos Kirz, Cheng-Hao Ko, S. Lindaas, Sue Wirick, Harald Ade, Xinyi Zhang, Henry N. Chapman, Chris Jacobsen, S. Williams, Christopher Buckley, Malcolm R. Howells
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 87:92-97
Inner shell processes in the light elements provide the contrast mechanisms for soft X-ray microscopy. Bright X-ray sources and precision focusing elements have led to the development of high resolution instruments. Our efforts in scanning microscopy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7f15866a85f57280ddbe2604048e94b6
https://doi.org/10.1016/0168-583x(94)95242-6
https://doi.org/10.1016/0168-583x(94)95242-6
Autor:
Xiaodong Zhang, S. S. Lamm, Chris Jacobsen, J. Van't Hof, Janos Kirz, S. Lindaas, S. Williams
Publikováno v:
Journal of Microscopy. 170:155-165
Summary Radiation damage to Vicia faba chromosome structure, as measured by the mass loss, was determined in the scanning transmission X-ray microscope for unstained specimens in both the wet and dry states. Dried specimens remain undamaged after eit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6bb87562fa61f66e63f33af680e06ff7
https://doi.org/10.1111/j.1365-2818.1993.tb03335.x
https://doi.org/10.1111/j.1365-2818.1993.tb03335.x
Autor:
Chris Jacobsen, Harald Ade, S. Williams, S. Lindaas, David Sayre, Janos Kirz, I. McNulty, Malcolm R. Howells, Xiaodong Zhang, Cheng-Hao Ko
Publikováno v:
Review of Scientific Instruments. 63:557-563
The Soft X‐ray Undulator beamline at the NSLS supports a soft x‐ray imaging program including scanning transmission microscopy, scanning photoemission microscopy, Gabor and Fourier transform holography, and large angle diffraction. Zone plates fr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7e0c5f1cd4136658b9899e37de19f172
https://doi.org/10.1063/1.1142705
https://doi.org/10.1063/1.1142705
Autor:
Erik H. Anderson, Eshang Tang, Janos Kirz, Sid Hellman, Menno Oversluizen, Stephen S. Rothman, Dieter P. Kern, I. McNulty, David Attwood, Mark L. Rivers, S. Lindaas, D. Shu, Chris Jacobsen, Kaarin Goncz, Harald Ade, Phil Batson, Christopher Buckley, Harvey Rarback
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 291:54-59
The scanning transmission soft X-ray microscope (STXM) that has been under development at the National Synchrotron Light Source [H. Rarback et al., Rev. Sci. Instr. 59 (1988) 52] has been substantially ungraded for operation with the X1 undulator [C.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a177578b113e959179d7023eeafc164b
https://doi.org/10.1016/0168-9002(90)90033-3
https://doi.org/10.1016/0168-9002(90)90033-3
Autor:
F. Camilo, N. Iskander, Sid Hellman, I. McNulty, R. DiGennaro, Samuel Krinsky, Menno Oversluizen, Harvey Rarback, Janos Kirz, Chris Jacobsen, D. Shu, Christopher Buckley, M. Sharnoff, S. Lindaas, Malcolm R. Howells, David Sayre, Stephen S. Rothman, Harald Ade
Publikováno v:
Journal of X-Ray Science and Technology. 2:274-296
An undulator-based beamline was built and commissioned at the National Synchrotron Light Source to provide tunable coherent radiation in the 200–800 eV range. The low emittance of the storage ring means that the undulator source has high brightness
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f6e2d0becd21cc3fc0518bb7997a4667
https://doi.org/10.3233/xst-1990-2404
https://doi.org/10.3233/xst-1990-2404
Autor:
Erik H. Anderson, Menno Oversluizen, Chris Jacobsen, Harald Ade, David Attwood, Janos Kirz, Sid Hellman, Mark L. Rivers, Dieter P. Kern, I. McNulty, S. Lindaas, David Sayre, Stephen S. Rothman, Harvey Rarback, Malcolm R. Howells, Christopher Buckley, D. Shu
Publikováno v:
Physica Scripta. :12-17
Soft x-rays are attractive for microscopy because they tend to be less damaging to specimens than charged probes. In addition their interactions with specimens can result in element-specific information and the penetration depth is adjustable by choi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2c8f0d5334319a9f7bcff04769be3abf
https://doi.org/10.1088/0031-8949/1990/t31/001
https://doi.org/10.1088/0031-8949/1990/t31/001
Publikováno v:
X-Ray Microscopy and Spectromicroscopy ISBN: 9783642721083
Athough x-ray holography has a long history [11], it is only in recent times that short-wavelenth lasers and undulator x-ray sources have opened the possibility for competitive imaging performance. Experiments using the in-line (Gabor) geometry have
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fb5227c665b79189a6f4781d1ef94d4e
https://doi.org/10.1007/978-3-642-72106-9_19
https://doi.org/10.1007/978-3-642-72106-9_19
Autor:
C. Jacobsen, J. Kirz, J. Maser, A. Osanna, S. Spector, S. Wang, S. Wirick, B. Calef, M. Howells, S. Lindaas, D. Pinkus, D. Tennant
Publikováno v:
Applications of High Field and Short Wavelength Sources VII.
Discussions of x-ray holography as a demanding application for high intensity sources date back at least two decades [1, 2], and x-ray lasers have been used in demonstrations of x-ray microscopy [3, 4, 5]. At the same time, synchrotron-based x-ray mi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3bea7294582fd05c214820322e53545b
https://doi.org/10.1364/hfsw.1997.tha2
https://doi.org/10.1364/hfsw.1997.tha2
Autor:
Vivian Oehler, S. Lindaas, Sue Wirick, Chris Jacobsen, Shirong Guo, Ilan Spector, S. Williams, Xiaodong Zhang
Publikováno v:
SPIE Proceedings.
Scanning luminescence x-ray microscopy is based on collecting visible light emission from a sample region illuminated by an x-ray microprobe. We have tested the resolution of the method using P31 phosphor grains, and have obtained luminescence images
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5a892ac52e179453e90c1c10951654a8
https://doi.org/10.1117/12.138735
https://doi.org/10.1117/12.138735