Zobrazeno 1 - 8
of 8
pro vyhledávání: '"S. L. Kaberline"'
Autor:
Mark Edward Nichols, S. L. Kaberline
Publikováno v:
Journal of Coatings Technology and Research. 10:427-432
The diffusion behavior of two hindered amine light stabilizers (HALS) [bis(1-octyloxy-2,2,6,6-tetramethyl-4-piperidinyl)-sebacate and bis(1,2,2,6,6-pentamethyl-4-piperidinyl)-sebacate] in an automotive clearcoat has been quantified via time-of-flight
Publikováno v:
Polymer Degradation and Stability. 65:37-45
Time-of-flight secondary ion mass spectroscopy has been used to image the 18 O-labeled products formed in all coating layers when automotive paint systems are exposed to ultraviolet light and heat in an 18 O 2 atmosphere. The 18 O − ion intensity m
Autor:
J. E. deVries, Larry P. Haack, Joseph W. Holubka, John L. Gerlock, Ray A. Dickie, T. J. Prater, S. L. Kaberline, J. Chakel
Publikováno v:
Progress in Organic Coatings. 25:95-108
Two examples of recent advances in spatially resolved surface analytical characterization of paint and adhesive chemistries are presented. The examples extend previous analytical capabilities by combining the molecular specificity and bonding informa
Publikováno v:
Surface and Interface Analysis. 20:115-120
An x-ray photoelectron spectroscopy (XPS) mapping technique was developed to define spatially the interfacial chemistry of adhesive-adherent debonding. The technique was used to identify mechanisms of corrosion-induced bond failure for an epoxy adhes
Publikováno v:
MRS Proceedings. 710
SFM probe tips have been functionalized with polypropylene (PP) layers by immersion into dilute solution. The immersion process was carefully controlled and monitored using a programmable dynamic contact angle analyzer (DCA) equipped with a microbala
Autor:
N. S. McIntyre, T. J. Prater, J. E. deVries, William J. Chauvin, S. L. Kaberline, Joseph W. Holubka, Dennis Schuetzle
Publikováno v:
Surface and Interface Analysis. 8:195-203
Analyse de stratifies de resine epoxyde de chlorure de polyvinylidene sur des substrats de teflon
Publikováno v:
Review of Scientific Instruments. 60:53-64
A secondary ion mass spectrometer (SIMS) has been developed for the surface analysis of chemically complex samples. The instrument has an ion transmission efficiency of 12% and an abundance sensitivity of better than 107 at 500 mass resolution. A com
Publikováno v:
Chemischer Informationsdienst. 8