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pro vyhledávání: '"S. L. Ammu"'
Publikováno v:
Physical Review Letters. 95
Synchrotron x-ray diffraction is used to compare the misfit strain and composition in a self-organized nanowire array in an InAs/GaSb superlattice with InSb interfacial bonds to a planar InAs/GaSb superlattice with GaAs interfacial bonds. It is found
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::15ce159fb5f41d84ed581965ed4d6f01
https://doi.org/10.1103/physrevlett.95.096104
https://doi.org/10.1103/physrevlett.95.096104
