Zobrazeno 1 - 10
of 60
pro vyhledávání: '"S. Kudelka"'
Publikováno v:
Materials and Corrosion. 49:161-168
A combined application of several microtechniques is presented and discussed with the Ti/TiO 2 and Zr/ZrO 2 -systems as an example. All measurements were carried out on single grains of technical materials in order to detect and quantify the effect o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c8f5bc8faf6f816296cf9ff740d60a52
https://doi.org/10.1002/(sici)1521-4176(199803)49:3<161::aid-maco161>3.0.co
https://doi.org/10.1002/(sici)1521-4176(199803)49:3<161::aid-maco161>3.0.co
Publikováno v:
Electrochimica Acta. 43:119-130
Ti and its alloy Ti0.2Pd are considered as promising materials for the manufacture of highlevel nuclear waste (HLW) containers which could act as an engineered barrier in a rock salt repository. Despite their extremely high resistance to general corr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a4488846c431aa3338c567bfc2fed960
https://doi.org/10.1016/s0013-4686(97)00240-5
https://doi.org/10.1016/s0013-4686(97)00240-5
Autor:
J. W. Schultze, S. Kudelka
Publikováno v:
The Electrochemical Society Interface. 6:28-31
Corrosion research has had a strong interaction with many fields of science and technology. On the one hand, all components of microscopic high technology systems have to be highly corrosion resistant. The corrosion of these microscopic systems has b
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3b5eee4ea5232c49b105a7917d42a0ee
https://doi.org/10.1149/2.f05972if
https://doi.org/10.1149/2.f05972if
Autor:
J.W. Schultze, S. Kudelka
Publikováno v:
Electrochimica Acta. 42:2817-2825
To clarify the correlation between photoelectrochemical images and surface reactivity, investigations of ellipsometry (dox, structure), coulometry (d), capacitance (ND) and iph were carried out on single grains (hkl) of passive titanium. The results
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e99e8c217d94410c6f794a6174b601b6
https://doi.org/10.1016/s0013-4686(97)00085-6
https://doi.org/10.1016/s0013-4686(97)00085-6
Publikováno v:
Berichte der Bunsengesellschaft für physikalische Chemie. 100:1798-1801
A new in-situ ellipsometric procedure has been used for determination of the optical properties and thickness of polyaniline films as a function of. the redox state in sulphuric and p-toluenesulfonic acids. The results could be interpreted successful
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8aa2ef769dfd8958a629ad3169498f4f
https://doi.org/10.1002/bbpc.19961001107
https://doi.org/10.1002/bbpc.19961001107
Publikováno v:
Electrochimica Acta. 41:863-870
Potentiodynamic (slow) and potentiostatic (fast) TiO2 layer formation on different oriented Ti single crystals of a coarse grain sample is compared. The crystal orientations were determined by the new AME-method (Anisotropy Micro Ellipsometry). Cyclo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cddf664ee71f072fc106e8a1eedd4aa4
https://doi.org/10.1016/0013-4686(95)00375-4
https://doi.org/10.1016/0013-4686(95)00375-4
Publikováno v:
Berichte der Bunsengesellschaft für physikalische Chemie. 99:1020-1027
Electronic properties of passive films (d ≤ 20 nm) on single grains of polycrystalline Titanium were investigated by micro-ellipsometry and electrochemical methods using photoresist microelectrodes with defined areas. A number of experimental impro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4095c25b1e3709ff6cbaf7c28c3bab07
https://doi.org/10.1002/bbpc.199500025
https://doi.org/10.1002/bbpc.199500025
Autor:
S Kudelka, A Michaelis
Publikováno v:
New Trends in Electrochemical Technology ISBN: 9780415273558
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::79199f3a4ed806d738838ac043302065
https://doi.org/10.4324/9780203219218_chapter_5
https://doi.org/10.4324/9780203219218_chapter_5
Autor:
G. Aichmayr, A. Avellan, G. S. Duesberg, F. Kreupl, S. Kudelka, M. Liebau, A. Orth, A. Sanger, J. Schumann, O. Storbeck
Publikováno v:
2007 IEEE Symposium on VLSI Technology.
Carbon is proposed as a new FEOL material with high conductivity and thermal stability for CMOS integration. Here the application of carbon-based electrodes for future DRAM cell capacitors is presented. Trench capacitors with high-k dielectrics have
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ce1ca3c511be7228c6765d19ba72f1d9
https://doi.org/10.1109/vlsit.2007.4339686
https://doi.org/10.1109/vlsit.2007.4339686
Autor:
Andreas Orth, A. Scholz, P. F. Wand, G. Aichmayr, Rolf Weis, Andreas Spitzer, S. Wege, Marc Strasser, A. Sieck, Till Schloesser, T. Hecht, Wolfgang Mueller, Matthias Goldbach, S. Kudelka, F. Lau, Joachim Nuetzel, W. Bergner
Publikováno v:
2006 International Symposium on VLSI Technology, Systems, and Applications.
This paper reviews the DRAM technology challenges for overcoming the 50nm barrier. First the product requirements and barriers to shrink the DRAM cell beyond 50nm will be addressed. Then the technology solutions for DRAM cell capacitor, cell transist
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ac9d495ac315a76ba208c62b88495f2c
https://doi.org/10.1109/vtsa.2006.251081
https://doi.org/10.1109/vtsa.2006.251081