Výsledky vyhledávání - "S. K. Savel'ev"

Procedure of a Modified Standard–Background Method in the X-Ray Fluorescence Analysis of Complex Multicomponent Samples

Publikováno v: Journal of Analytical Chemistry. 75:18-23

X-ray fluorescence (XRF) analysis is one of the most widespread methods of the determination of the elemental composition of various materials. However, its application is complicated by pronounced matrix effects. These effects can be taken into acco

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::e6437733f030e4054a41b0585f31132a
https://doi.org/10.1134/s1061934820010037

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X-ray fluorescence analysis based on the modified standard-background procedure in the system of analytical control of solid-phase products of metallurgical precious metal products

Autor: A. V. Bakhtiarov, O. V. Devitsina, S. N. Chuprina, R. V. Sapunov, V. A. Zaitsev, S. K. Savel’ev

Publikováno v: Inorganic Materials. 51:1423-1430

An original approach to the X-ray fuorescence analysis of metallutgical precious metal products, in terms of which an equation of a certain type determined from theoretical and semiempirical considerations was proposed instead of multiple regression

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::b96b455f145b451b6ed0eb6592954e61
https://doi.org/10.1134/s0020168515140034

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Energy-dispersive X-ray-absorption edge spectrometry with spectrum filtration by X-ray mirrors

Autor: S. S. Gizha, V. M. Senkov, S. K. Savel’ev, A. G. Tur’yanskii

Publikováno v: Technical Physics Letters. 40:346-349

A highly sensitive energy-dispersive scheme with a semiconductor spectrometer is proposed for determining impurity concentrations from the X-ray-absorption edge spectra. The optimization of spectrum in a band studied is ensured by sequential reflecti

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::d0d3f812701304568c860a45746275a4
https://doi.org/10.1134/s1063785014040269

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Software support of the technology of substrates for multilayer interference structures

Autor: I. S. Savel’ev, S. K. Savel’ev

Publikováno v: Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 5:529-532

A computer-aided machining (CAM) system for nanoscale polishing of cylindrical optical elements with a flat, parabolic, elliptic, or table-defined generatrix we developed is described. This system is one of the key components of the fabrication of te

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::2166be853e9370590ac68d551da52d5a
https://doi.org/10.1134/s1027451011060176

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