Zobrazeno 1 - 5
of 5
pro vyhledávání: '"S. J. Amster"'
Autor:
S. C. Singhal, S. J. Amster
Publikováno v:
Quality and Reliability Engineering International. 5:149-154
The expected number of circuit pack failures is an important input to the accurate planning of the inventory level of spares. The failure rate of a circuit pack depends on its age and is generally higher during the infant mortality period (frequently
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::61b2a6107ccfb850c1a65c02a89af3e9
https://doi.org/10.1002/qre.4680050209
https://doi.org/10.1002/qre.4680050209
Publikováno v:
Bell System Technical Journal. 61:2333-2364
This paper reviews the major aspects of planning and conducting field-tracking studies, including: (i) establishing well-defined, realistic objectives; (ii) designing data collection and analysis procedures to meet the objectives; and (iii) ensuring
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::916b6bc72ff187a7363983ec2d0bf3df
https://doi.org/10.1002/j.1538-7305.1982.tb03426.x
https://doi.org/10.1002/j.1538-7305.1982.tb03426.x
Autor:
R. Cerino, S. J. Amster
Publikováno v:
IEEE Transactions on Reliability. :124-127
This paper presents a method for selecting spare modules to support system availability in a cost-effective manner. We apply the method to determine the sparing requirements for a specialized power unit used throughout a telephone transmission system
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0087307d215201bd9291842770e80320
https://doi.org/10.1109/tr.1978.5220279
https://doi.org/10.1109/tr.1978.5220279
Autor:
S. J. Amster
Publikováno v:
Technometrics. 7:656-657
Preface to the Classics Edition Preface 1. Introduction. Historical Background of the Mathematical Theory of Reliability Definitions of Reliability 2. Failure Distributions. Introduction Typical Failure Laws The Exponential as the Failure Law of Comp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::926125a20fc0e28ea25a35f335801d71
https://doi.org/10.1080/00401706.1965.10490311
https://doi.org/10.1080/00401706.1965.10490311
Autor:
S. J. Amster
Publikováno v:
Technometrics. 29:387-387
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f2a083b17a6407298772373135fd57bd
https://doi.org/10.1080/00401706.1987.10488261
https://doi.org/10.1080/00401706.1987.10488261