Zobrazeno 1 - 10
of 23
pro vyhledávání: '"S. G. Simakin"'
Autor:
A. B. Churilov, A. S. Rudy, D. E. Pukhov, M. A. Smirnova, S. G. Simakin, I. V. Zhuravlev, V. I. Bachurin
Publikováno v:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 14:784-790
Angular dependences of the surface layer composition and the sputtering yield of silicon upon irradiation of the surface with a focused beam of gallium ions with an energy of 30 keV are obtained. The surface composition is analyzed by scanning Auger
Autor:
I. L. Shul’pina, S. G. Simakin, A. N. Zaichenko, S. Yu. Martyushov, B. M. Seredin, Andrey A. Lomov
Publikováno v:
Technical Physics Letters. 46:279-282
A technique that allows one to form thick thermomigration silicon layers heavily doped with gallium for prospective power electronic devices is proposed. The dependences of the perfection of structure and the composition of the layers on the temperat
Publikováno v:
Russian Microelectronics. 48:402-408
The dependences of the thickness of the TiO2 layer formed on the TiN surface on a partial pressure (flow) of oxygen in an argon-oxygen plasma of a magnetron sputtering system are established by secondary-ion mass spectrometry. The obtained dependence
Autor:
E. O. Parshin, A. S. Rudy, A. A. Mironenko, V. I. Bachurin, A. B. Churilov, S. G. Simakin, N. S. Melesov
Publikováno v:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 13:300-305
The results of depth profiling a four layered Si–O−Al thin film with different concentrations of elements in the layers are presented. Secondary-ion mass spectrometry (SIMS) and Rutherford backscattering (RBS) facilities are used to obtain the de
Publikováno v:
Russian Microelectronics. 47:381-387
Several experimental methods for controlling the quality of the multilayer film structures used for the fabrication of magnetic tunneling junctions (MTJs) are considered. A multilayer magnetoresistive structure of the following composition is deposit
Publikováno v:
Russian Microelectronics. 45:242-255
Using secondary ion mass spectrometry, we investigate the oxidation of titanium nitride films fabricated by reactive magnetron sputtering under specific conditions of burning plasma in the argon and oxygen mixture in a vacuum chamber of a magnetron s
Publikováno v:
Doklady Earth Sciences. 464:1039-1043
On the basis of the local composition, baddeleyite grains that were less altered due to interaction with an alkaline melt and corresponded to the primary stage of crystallization of the intrusion were selected from the carbonatite intrusion of the Pr
Autor:
V. Yu. Prokofiev, L. Ya. Aranovich, A. N. Pertsev, N. S. Bortnikov, Olga Ageeva, V. E. Beltenev, S. G. Simakin, S. E. Borisovsky
Publikováno v:
Doklady Earth Sciences. 460:174-178
Publikováno v:
Technical Physics Letters. 40:145-148
We have studied the influence of long-term low-temperature (220°C) annealing in a constant magnetic field on the composition of granular cobalt-copper (Co-Cu) alloy films deposited by the ion-plasma method onto hot silicon substrates. The magnetic-f
Publikováno v:
Technical Physics Letters. 39:556-559
We have studied the effect of a constant magnetic field on the structure and composition of cobalt-copper (Co-Cu) granular alloy films deposited by the ion-plasma method. The phenomenon of magnetomigration of the main components and impurities has be