Zobrazeno 1 - 10
of 26
pro vyhledávání: '"S. E. Hörnström"'
Publikováno v:
Surface and Interface Analysis. 20:427-433
Chromating is frequently used for temporary corrosion protection and as a pretreatment before organic coating of aluminium, zinc and aluminium/zinc alloys. In this work we have studied the composition and the chemical state of pretreated Al-43.4Zn-1.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ed92e796c134dba9ed83f0fde764f83b
https://doi.org/10.1002/sia.740200516
https://doi.org/10.1002/sia.740200516
Publikováno v:
Surface and Interface Analysis. 19:379-385
Chromating of metals has been used for a long time as corrosion protection. In this study two commercial products for chromating, one based on chromates (Iridite 9L-6) and one with an addition of a polymer (Okem Coat F1), have been analysed on hot-di
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c87247cc7228ef9ab0548db5ad8caa18
https://doi.org/10.1002/sia.740190171
https://doi.org/10.1002/sia.740190171
Publikováno v:
Surface and Interface Analysis. 19:121-126
Zinc-coated steel strip is painted in coil-coating plants in order to improve corrosion resistance and to provide a decorative surface. We have used Auger ang x-ray photoelectron spectroscopy to characterize the conversion coating formed during pretr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::123049d551fd9cc00912c939b743c963
https://doi.org/10.1002/sia.740190124
https://doi.org/10.1002/sia.740190124
Publikováno v:
Surface Characterization: A User's Sourcebook
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::518796031adbe56169e66a906a68173f
https://doi.org/10.1002/9783527612451.ch17
https://doi.org/10.1002/9783527612451.ch17
Autor:
L. Krusin-Elbaum, A. Robertsson, S. E. Hörnström, P. M. Fryer, O. Thomas, S. F. Gong, A. Charai, James Mckell Edwin Harper
Publikováno v:
Surface and Interface Analysis. 14:7-12
The Interfacial reactions between Al and RuO2, MoOx and WNx diffusion barriers on Si (100) wafers have been studied. The diffusion barrier structures were analyzed before and after various heat treatments using Auger electron spectroscopy (AES) and c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::db2907a3c334ef5923b2dcf6a44847e2
https://doi.org/10.1002/sia.740140104
https://doi.org/10.1002/sia.740140104
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 7:875-880
Diffusion barrier layers with improved stability are needed in very large scale integrated (VLSI) devices to prevent aluminum from interacting with silicon, under the demanding constraints of shallow junctions and processing heat cycles. We present a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b68188ff6da4ae255532aad4fc537512
https://doi.org/10.1116/1.575814
https://doi.org/10.1116/1.575814
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 7:784-789
A comparative study between the high‐temperature diffusion barriers against either Al or Cu has been made. Several conducting oxides (RuO2, Mo–O) and nitrides (W–N) were examined using cross‐sectional transmission electron microscopy, Auger e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::92ed3a4d9934cf32a473b87f2f139641
https://doi.org/10.1116/1.575840
https://doi.org/10.1116/1.575840
Surface shifted core levels used as a tool to identify surface segregation in EuAu and YbAu alloys
Publikováno v:
Surface Science. 117:475-481
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7938c21b9433bcce80f661bdf9b1bf16
https://doi.org/10.1016/0039-6028(82)90532-5
https://doi.org/10.1016/0039-6028(82)90532-5
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 5:1447-1450
The reactions between a thin metal film of Al or Ag and a layer of amorphous Si have been investigated using transmission electron microscopy and Auger electron spectroscopy. The samples were analyzed after deposition and after different heat treatme
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b300ae4eff790c65935defb1b68e620b
https://doi.org/10.1116/1.574618
https://doi.org/10.1116/1.574618
Publikováno v:
Journal of Applied Physics. 62:3726-3732
Thin‐film multilayer structures of a‐Si/Al/a‐Si and a‐Si/Sb/a‐Si were deposited by electron‐beam evaporation. The microstructure and the electrical properties of as‐deposited and annealed (T
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6dc3e4630615137b253cbd6c583ec897
https://doi.org/10.1063/1.339256
https://doi.org/10.1063/1.339256