Zobrazeno 1 - 10
of 19
pro vyhledávání: '"S. B. Astaf'ev"'
Autor:
L. G. Yanusova, S. B. Astaf’ev
Publikováno v:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 15:696-701
A method for determining the structural parameters of the Langmuir molecular layer in accordance with data on X-ray reflectometry and grazing incidence diffraction is proposed. These techniques complement each other, because scattering in the layer p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d54673c3de3b4f321dae5f50099df98b
https://doi.org/10.1134/s1027451021040042
https://doi.org/10.1134/s1027451021040042
Autor:
S. B. Astaf’ev, L. G. Yanusova
Publikováno v:
Crystallography Reports. 66:1082-1084
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cb9dee4f550ec3a97ac3c47377482fc1
https://doi.org/10.1134/s1063774521060031
https://doi.org/10.1134/s1063774521060031
Autor:
S. B. Astaf’ev, L. G. Yanusova
Publikováno v:
Crystallography Reports. 63:791-795
Specific features of the use of wavelet transform for estimating the thickness of layers and their order in a film density profile based on X-ray and synchrotron reflectometry data are considered. Some ways are proposed to reveal the characteristic f
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::03a56f2144c9152466a72850fde27afd
https://doi.org/10.1134/s1063774518050036
https://doi.org/10.1134/s1063774518050036
Autor:
S. B. Astaf’ev, L. G. Yanusova
Publikováno v:
Crystallography Reports. 64:119-121
A method is proposed to estimate (using the autocorrelation function (ACF)) the thickness of layers determining the electron density profile of a thin film. The method does not require additional conditions and is applicable to an arbitrary reflectiv
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::951076b8c0064e7c382f47eb8592590c
https://doi.org/10.1134/s1063774518060020
https://doi.org/10.1134/s1063774518060020
Publikováno v:
Crystallography Reports. 62:318-323
The application of time–frequency wavelet analysis for solving the reflectometry inverse problem is considered. It is shown that a simultaneous transform of specular intensity curve, depending on the grazing angle and spatial frequency, allows one
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b655b6f0612764a0474b2d6bd518ede5
https://doi.org/10.1134/s1063774517020055
https://doi.org/10.1134/s1063774517020055
Publikováno v:
Computational Mathematics and Modeling. 25:500-513
The article presents the main mathematical methods developed during the design of the BARD software package for multilayer thin film reflectometry. It is shown that the application of these methods broadens the possibilities of analyzing thin-film st
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8b2f7c230d848cd6354d142fbf153209
https://doi.org/10.1007/s10598-014-9244-z
https://doi.org/10.1007/s10598-014-9244-z
Publikováno v:
Crystallography Reports. 58:333-337
A method for constructing and analyzing sections of functional χ2 in solution of the inverse problem of reflectometry which makes it possible to observe the motion of local minima with a simultaneous change in several model parameters and facilitate
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::929e055e45e5edc5f327b89d26bf52ed
https://doi.org/10.1134/s1063774513020028
https://doi.org/10.1134/s1063774513020028
Publikováno v:
Crystallography Reports. 57:134-143
The main principles of developing the Basic Analysis of Reflectometry Data (BARD) software package, which is aimed at obtaining a unified (standardized) tool for analyzing the structure of thin multilayer films and nanostructures of different nature
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::234518d76336a9aa66e8178f8aabe621
https://doi.org/10.1134/s1063774511040031
https://doi.org/10.1134/s1063774511040031
Publikováno v:
Crystallography Reports. 55:127-135
The possibility of estimating the layered film structural parameters by constructing the autocorrelation function P F (z) (referred to as the Patterson differential function) for the derivative dρ/dz of electron density along the normal to the sampl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c8de9be8b1559b6f9cc52e43f7419c81
https://doi.org/10.1134/s1063774510010190
https://doi.org/10.1134/s1063774510010190
Publikováno v:
Crystallography Reports. 51:685-689
A schematic of a reflectometric experiment whose results make it possible to reconstruct the structure of multilayer films on substrates is proposed. A mathematical apparatus is developed that allows for determining the numerical values of the main p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bbfd156318505e6d0144a646f7a55b47
https://doi.org/10.1134/s1063774506040249
https://doi.org/10.1134/s1063774506040249