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pro vyhledávání: '"S. A. Muravov"'
Publikováno v:
Journal of Measurements in Engineering, Vol 1, Iss 1, Pp 23-27 (2013)
In recent years, intensive development of field-effect transistors on metal-ferroelectric-semiconductor for use, as non-volatile memory elements. The principle of operation of these devices is as follows. Ferroelectric film contains a large number of