Zobrazeno 1 - 6
of 6
pro vyhledávání: '"S. A. Kitan"'
Autor:
A. Yu. Ustinov, A. M. Maslov, S. A. Dotsenko, S. A. Kitan, Alexander V. Shevlyagin, Andrey V. Gerasimenko, A. S. Gouralnik, E. A. Koblova, Igor M. Chernev, N. G. Galkin, Konstantin N. Galkin, V. M. Il'yashenko
Publikováno v:
Applied Surface Science. 439:282-284
Publikováno v:
Technical Physics. 59:1017-1026
The growth of a Fe sublayer 1.5–14.0 monolayers (MLs) thick and a Cu film (about 5 MLs) on this sublayer is studied at a reduced temperature (1240°C) and an elevated temperature (1400°C) of a Fe source and at a reduced temperature (900°C) of a C
Publikováno v:
Technical Physics Letters. 38:324-327
We have studied the influence of the upper Si monolayer (ML) in Fe-Si interlayers on the mechanism of subsequent growth of 7-ML-thick Cu films during molecular beam deposition. The Fe-Si interlayers and Cu films were studied in ultrahigh vacuum by th
Publikováno v:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 5:734-745
Auger-electron spectroscopy, electron-energy loss spectroscopy, low-energy electron diffraction, and atomic-force microscopy are employed to investigate the growth mechanism, composition, structural and phase states, and morphology of Cu films (0.1
Publikováno v:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 3:734-746
This paper is devoted to the study of the morphology, growth, electronic structure, and stability of ultrathin (0.03–3 nm) Co and Fe films on the Si(111) and Si(100) surfaces using Auger-electron spectroscopy, electron-energy loss spectrometry, low
Publikováno v:
Technical Physics Letters. 33:486-489
The interaction of iron atoms with a silicon single crystal substrate and the initial stages of growth in this system have been studied using Auger electron spectroscopy, electron energy loss spectroscopy, and low-energy electron diffraction in the c