Zobrazeno 1 - 10
of 1 150
pro vyhledávání: '"S. A. Kelso"'
Publikováno v:
The Science Teacher, 1966 Feb 01. 33(2), 62-62.
Externí odkaz:
https://www.jstor.org/stable/24151600
Publikováno v:
Journal of Agricultural Safety and Health. 14:431-439
Many farmers with disabilities choose to modify their work environments to accommodate their personal abilities; however, modified tractors may present greater risk to the operator as they are often one-of-a-kind designs that have not been subjected
Publikováno v:
Journal of Applied Physics. 73:7035-7040
Beam‐profile reflectometry is a new technique for measuring the thickness and optical constants of dielectric, semiconducting, and thin metal films. The technique consists of measuring the intensity profile of a highly focused beam reflected from t
Publikováno v:
The Journal of Physiology. 449:705-718
1. N-Methyl-D-aspartate (NMDA) receptors were expressed in Xenopus oocytes injected with rat brain RNA. The modulation of NMDA-induced currents was examined by activating protein kinase C (PKC) either directly (using phorbol esters) or indirectly (vi
Publikováno v:
The Journal of Physiology. 440:257-271
1. Intracellular neuronal activity was recorded in rat preoptic-anterior hypothalamic tissue slices. Thirty neurones were classified as warm sensitive, cold sensitive or temperature insensitive, based on their firing rate response to temperature chan
Publikováno v:
Journal of agricultural safety and health. 14(4)
Many farmers with disabilities choose to modify their work environments to accommodate their personal abilities; however, modified tractors may present greater risk to the operator as they are often one-of-a-kind designs that have not been subjected
Publikováno v:
Applied Physics Letters. 60:1301-1303
We describe a new technique for measuring the thickness and optical constants of dielectric, semiconducting, and thin metal films. Beam profile reflectometry provides excellent precision for films as thin as 30 A and as thick as 20 000 A. The techniq
Autor:
Jeffrey T. Fanton, Jim P. Simmons, Allan Rosencwaig, Jon Opsal, S. M. Kelso, David L. Willenborg
Publikováno v:
SPIE Proceedings.
Measurements of ultra-thin films (
Autor:
Zhang, Xiaotian1 (AUTHOR), Dou, Zhi2 (AUTHOR), Kim, Seung Hyun2 (AUTHOR), Upadhyay, Gaurav2 (AUTHOR), Havert, Daniel3 (AUTHOR), Kang, Sehong2 (AUTHOR), Kazemi, Kimia2 (AUTHOR), Huang, Kai‐Yu4 (AUTHOR), Aydin, Onur1 (AUTHOR), Huang, Raymond2 (AUTHOR), Rahman, Saeedur2 (AUTHOR), Ellis‐Mohr, Austin5 (AUTHOR), Noblet, Hayden A.6,7 (AUTHOR), Lim, Ki H.6 (AUTHOR), Chung, Hee Jung1,6,7,8 (AUTHOR), Gritton, Howard J.8,9 (AUTHOR), Saif, M. Taher A.1,2 (AUTHOR), Kong, Hyun Joon1,4 (AUTHOR), Beggs, John M.3 (AUTHOR), Gazzola, Mattia1,2 (AUTHOR) mgazzola@illinois.edu
Publikováno v:
Advanced Science. 3/20/2024, Vol. 11 Issue 11, p1-16. 16p.
Autor:
McVilly, Keith1 (AUTHOR) keith.mcvilly@unimelb.edu.au, McCarthy, Molly1 (AUTHOR), Day, Andrew1 (AUTHOR), Birgden, Astrid2 (AUTHOR), Malvaso, Catia3 (AUTHOR)
Publikováno v:
Psychiatry, Psychology & Law. Dec2023, Vol. 30 Issue 6, p789-811. 23p.