Zobrazeno 1 - 10
of 837
pro vyhledávání: '"S W, Wilkins"'
Publikováno v:
Review of Scientific Instruments. 68:2774-2782
A simple general treatment of x-ray image formation by Fresnel diffraction is presented; the image can alternatively be considered as an in-line hologram. Particular consideration is given to phase-contrast microscopy and imaging using hard x rays. T
Autor:
Steen Hansen, S. W. Wilkins
Publikováno v:
Acta Crystallographica Section A Foundations of Crystallography. 50:547-550
A Bayesian approach to the treatment of uncertainty in maximum-entropy maps is developed based on a deeper hypothesis space that includes the prior map. The new approach is able to take into account uncertainty in the knowledge of the prior and provi
Autor:
PEREZ-DÍAZ, M.1,2 mperez@uclv.edu.cu, RIGON, L.2,3, ARANA-PEÍÑA, L. M.2,3,4 Luigi.Rigon@ts.infn.it
Publikováno v:
Revista Cubana de Física. 7/15/2024, Vol. 41 Issue 1, p43-49. 7p.
Autor:
R A, Dilanian, C, Darmanin, J N, Varghese, S W, Wilkins, T, Oka, N, Yagi, H M, Quiney, K A, Nugent
Publikováno v:
Protein science : a publication of the Protein Society. 20(2)
The application of powder diffraction methods to problems in structural biology is generally regarded as intractable because of the large number of unresolved, overlapping X-ray reflections. Here, we use information about unit cell lattice parameters
Autor:
Patrick W. Leech, S.R. Glanvill, S. W. Wilkins, C. J. Rossouw, N. Petkovic, J. Thompson, Martyn H. Kibel, M. S. Kwietniak, P. J. Gwynn, Andrew W. Stevenson, T. J. Elms, Geoff N. Pain, D. Gao, T. Warminski, L. S. Wielunski, C. Sandford, N. Bharatula
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 8:1067-1077
Specular HgTe–CdTe superlattice epilayers have been obtained on two 2‐in. diam GaAs or sapphire wafers per growth run using a horizontal metalorganic chemical vapor deposition (MOCVD) reactor in which the pyrolysis of the organometallics is induc
Autor:
S C, Mayo, P R, Miller, S W, Wilkins, T J, Davis, D, Gao, T E, Gureyev, D, Paganin, D J, Parry, A, Pogany, A W, Stevenson
Publikováno v:
Journal of microscopy. 207(Pt 2)
We outline a new approach to X-ray projection microscopy in a scanning electron microscope (SEM), which exploits phase contrast to boost the quality and information content of images. These developments have been made possible by the combination of a
Autor:
Dejea, Hector1,2 (AUTHOR), Pierantoni, Maria1 (AUTHOR), Orozco, Gustavo A.1 (AUTHOR), B. Wrammerfors, E. Tobias1 (AUTHOR), Gstöhl, Stefan J.3 (AUTHOR), Schlepütz, Christian M.3 (AUTHOR), Isaksson, Hanna1 (AUTHOR) hanna.isaksson@bme.lth.se
Publikováno v:
Advanced Science. 6/5/2024, Vol. 11 Issue 21, p1-14. 14p.
Publikováno v:
II-VI Semiconductor Compounds
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::69c424e0b5a98c3d5c3c7de09694bd69
https://doi.org/10.1142/9789814439770_0001
https://doi.org/10.1142/9789814439770_0001
Publikováno v:
Optical Society of America Annual Meeting.
In this paper, a new class of x-ray focusing devices based on reflections from the interior surfaces of an array of capillaries is presented. The capillaries may have a range of cross sections, although square capillaries are predicted to offer the b
Autor:
Schreier, Julia1 (AUTHOR) j.schreier@umwelt-campus.de, Bröckel, Ulrich1 (AUTHOR)
Publikováno v:
Chemie Ingenieur Technik (CIT). Oct2023, Vol. 95 Issue 10, p1623-1628. 6p.