Zobrazeno 1 - 10
of 44
pro vyhledávání: '"S Stuerwald"'
Autor:
R H Bergmans, G Blobel, A. Kung, S Stuerwald, M Baas, H Nouira, H J Nieuwenkamp, G Baer, Gerjo Kok, M Tevoert
Publikováno v:
Measurement Science and Technology, 10, 26
A comparison of topography measurements of aspherical surfaces was carried out by European metrology institutes, other research institutes and a company as part of an European metrology research project. In this paper the results of this comparison a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2cb18631596909acc0f1437d4dba1a8b
http://resolver.tudelft.nl/uuid:346ac303-b0a8-4be7-8971-4ce485227710
http://resolver.tudelft.nl/uuid:346ac303-b0a8-4be7-8971-4ce485227710
Publikováno v:
Optical Micro- and Nanometrology V.
Interferometric form testing using computer generated holograms is one of the main full-field measurement techniques. Till now, various modified measurement setups for optical form testing interferometry have been presented. Currently, typical form d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::095485c4fd89896110f479a9538293ff
https://doi.org/10.1117/12.2052968
https://doi.org/10.1117/12.2052968
Autor:
Robert Schmitt, S. Stuerwald
Publikováno v:
SPIE Proceedings.
In production of ophthalmic freeform optics like progressive eyeglasses, the specimens are tested according to a standardized method which is based on the measurement of the vertex power on usually less than 10 points. For a better quality management
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::65c262f937846cbd4f29fd896672a345
https://doi.org/10.1117/12.2038343
https://doi.org/10.1117/12.2038343
Autor:
S. Stuerwald, Robert Schmitt
Publikováno v:
Emerging Digital Micromirror Device Based Systems and Applications V.
Optical, full field testing of aspheres and especially freeform optics still remains a challenging task. Till now, various measurement setups for wavefront characterisation have been presented for functional testing. These are primarily based on micr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::94143320d7958dead7ba381e5ab12048
https://doi.org/10.1117/12.2004845
https://doi.org/10.1117/12.2004845
Autor:
S. Stuerwald, R. Schmitt
Publikováno v:
Frontiers in Optics 2012/Laser Science XXVIII.
Both digital holographictechniques - one based on phase shifting microscopy and one on liquid crystal on silicon devices - are usually applied separately. In this work, the simultaneous realization of both modes is demonstrated and optimized.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7d254a48ce362cb7b36d4080d21ab21c
https://doi.org/10.1364/fio.2012.ftu3a.35
https://doi.org/10.1364/fio.2012.ftu3a.35
Autor:
S. Stuerwald, Robert Schmitt
Publikováno v:
SPIE Proceedings.
A variety of microscopy techniques allow measuring different local physical properties of a surface under test. One of the key properties of interest in production and development of micro- and nano components is a nanometer resolution even in a meas
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a1fb9647221f0d1191ec9488cbc9a3bf
https://doi.org/10.1117/12.910788
https://doi.org/10.1117/12.910788
Autor:
S. Stuerwald, R. Schmitt
Publikováno v:
SPIE Proceedings.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ef3caf345dd61ffc5709eeb110ca3ad0
https://doi.org/10.1117/12.903693
https://doi.org/10.1117/12.903693
Autor:
Robert Schmitt, S. Stuerwald
Publikováno v:
SPIE Proceedings.
The application of digital holographic microscopy offers quantitative phase contrast imaging of reflective and (partially) transparent samples. Low coherent light sources enable an increased resolution in phase shifting digital holography by the redu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::71fcc82321a3f08c1d41a1b1380a4108
https://doi.org/10.1117/12.854674
https://doi.org/10.1117/12.854674
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Conference
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