Zobrazeno 1 - 4
of 4
pro vyhledávání: '"S Siow, Kim"'
Autor:
Xie, Yijing, Wang, Yanjie, Mei, Yunhui, Xie, Haining, Zhang, Kun, Feng, Shuangtao, S Siow, Kim, Li, Xin, Lu, Guo-Quan
Publikováno v:
In Journal of Materials Processing Tech. May 2018 255:644-649
Publikováno v:
Sains Malaysiana. 47:619-633
Suis nanoelektromekanikal (NEM) mempunyai persamaan dengan suis konvensional semikonduktor apabila digunakan sebagai transistor dan penderia walaupun prinsip operasinya berbeza. Perbezaan prinsip operasi suis ini memberikan kelebihan kepada suis NEM
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ff77783e98bce7021ff66a6884ef41f3
https://doi.org/10.17576/jsm-2018-4703-24
https://doi.org/10.17576/jsm-2018-4703-24
Autor:
S. Siow Kim
Publikováno v:
Sains Malaysiana. 46:1047-1059
Kertas ini mengkaji teknologi pengelupasan untuk menghasilkan grafin, grafin oksida (GO) dan grafin oksida terturun (rGO). Empat teknologi pengelupasan yang utama dikenal pasti dalam tinjauan ini iaitu pengelupasan mekanik, pengelupasan cecair, inter
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::516a3cc45da1d5f6166dfb072d0e804c
https://doi.org/10.17576/jsm-2017-4607-06
https://doi.org/10.17576/jsm-2017-4607-06
In this report, we demonstrate that continuous improvement in XPS instruments and the calibration standards as well as analysis with standard component-fitting procedures can be used to determine the binding energies of compounds containing phosphoru
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d04fdfc6a1f9c1cbb190d77cb954a8e3
https://hdl.handle.net/11541.2/134449
https://hdl.handle.net/11541.2/134449
