Zobrazeno 1 - 10
of 22
pro vyhledávání: '"S S Fanchenko"'
Publikováno v:
Journal of Contemporary Physics (Armenian Academy of Sciences). 57:313-316
Publikováno v:
Semiconductors. 54:912-915
After the ion implantation of silicon into sapphire followed by high-temperature annealing, silicon and aluminosilicate precipitates are observed in the surface region of sapphire. X-ray measurements with the mapping of reciprocal space show the pres
Publikováno v:
Technical Physics. 63:700-710
Structure, optical properties, and resistance to sputtering are studied for a reflecting Mo-coating that is fabricated using magnetron deposition with simultaneous low-energy ion sputtering at the deposition rate that is higher than the etching rate.
Autor:
S. S. Fanchenko, A. V. Rogov
Publikováno v:
Technical Physics. 57:286-291
The influence of magnetron deposition conditions on the size of Au nanoparticles and their aggregates obtained by condensation in a neutral liquid is studied experimentally. A model is suggested in which the nanoparticles and aggregates form in a thi
Publikováno v:
Nanotechnologies in Russia. 4:802-805
A new method for generating a metal-nanoparticle colloidal solution by means of magnetron deposition on a chemically neutral metal on the surface of a flowing liquid in a high-cycle mixing scheme is proposed. The properties of the Au nanoparticle col
Publikováno v:
physica status solidi (a). 202:2737-2741
High-rate cathode growth of nanorods is observed for dc magnetron sputtering of graphite, germanium and molybdenum cathodes despite the sputtering. The growth of vertically aligned carbon nanorods using dc magnetron sputtering with deuterium as the w
Autor:
A. A. Nefedov, S. S. Fanchenko, U. Roth, L. Bartholomäus, Markus Heyde, Werner Moritz, S. E. Sbitnev, Klaus Rademann
Publikováno v:
physica status solidi (a). 176:943-952
The platinum etching during fluorination of the Pt surface of a Pt/LaF 3 /Si(111) sandwich structure is investigated by means of X-ray methods, atomic force microscopy (AFM), and quartz crystal microbalance (QCM). XeF 2 and F 2 have been used as sour
Publikováno v:
Physica B: Condensed Matter. 248:48-52
Recently developed high resolution X-ray methods have been used to characterize the structure of Pt/LaF 3 /Si samples. The asymptotic Bragg di⁄raction is used for the study of the LaF 3 /Si interface and the grazing-incidence X-ray di⁄raction (GI
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 405:459-462
The main features of the X-ray complex diffractometer for the Kurchatov Synchrotron Radiation Source are considered. Typical X-ray experiments for this diffractometer are discussed.
Autor:
V. A. Chaplanov, S. S. Fanchenko, N. E. Belova, S. A. Nazarov, A. A. Nefedov, D. Yu. Schumilov, P. A. Aleksandrov
Publikováno v:
Surface Review and Letters. :295-298
We report the results of crystal truncation rod study for the following heterostructure: GaInAsP layer grown on Zn-doped InP substrate. Two series of experiments have been performed within 4.5 years. The profiles of coherent (200) polarizability and