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Publikováno v:
Journal of microscopy. 260(1)
The effects of using a traction-free (plane-stress) assumption to obtain the full distortion tensor from high-resolution EBSD measurements are analyzed. Equations are derived which bound the traction-free error arising from angular misorientation of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::c45da9594ee5e8bfe28445b0dd80d436
https://pubmed.ncbi.nlm.nih.gov/26138919
https://pubmed.ncbi.nlm.nih.gov/26138919
