Zobrazeno 1 - 10
of 919
pro vyhledávání: '"S D, Findlay"'
Autor:
N. Shibata, Y. Kohno, A. Nakamura, S. Morishita, T. Seki, A. Kumamoto, H. Sawada, T. Matsumoto, S. D. Findlay, Y. Ikuhara
Publikováno v:
Nature Communications, Vol 10, Iss 1, Pp 1-5 (2019)
Electron microscopy typically requires strong magnetic lenses in order to reach atomic resolution, prohibiting the possibility to measure magnetic materials. The authors here present a lens design that enables atomic-resolution electron microscopy of
Externí odkaz:
https://doaj.org/article/93ddd7a9cc58420097f10420d2afc6e8
Autor:
Weilun Li, Bryan D. Esser, Anchal Yadav, Alison M. Funston, S. D. Findlay, Changlin Zheng, Joanne Etheridge
Publikováno v:
Acta Crystallographica Section A Foundations and Advances. 77:C239-C239
Autor:
C J, Humphreys, J T, Griffiths, F, Tang, F, Oehler, S D, Findlay, C, Zheng, J, Etheridge, T L, Martin, P A J, Bagot, M P, Moody, D, Sutherland, P, Dawson, S, Schulz, S, Zhang, W Y, Fu, T, Zhu, M J, Kappers, R A, Oliver
Publikováno v:
Ultramicroscopy. 176
We have used high resolution transmission electron microscopy (HRTEM), aberration-corrected quantitative scanning transmission electron microscopy (Q-STEM), atom probe tomography (APT) and X-ray diffraction (XRD) to study the atomic structure of (000
Publikováno v:
Ultramicroscopy. 96:65-81
In the previous paper, boundary conditions matching the probe to the crystal wave function in scanning transmission electron microscopy were applied by matching the whole wave function across the boundary. It is shown here how that approach relates t
Autor:
Baucom G; Department of Materials Science and Engineering, University of Florida, Gainesville, FL, 32611, USA., Hershkovitz E; Department of Materials Science and Engineering, University of Florida, Gainesville, FL, 32611, USA., Chojecki P; Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, 32611, USA., Nishida T; Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, 32611, USA., Tabrizian R; Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, 32611, USA., Kim H; Department of Materials Science and Engineering, University of Florida, Gainesville, FL, 32611, USA.
Publikováno v:
Small methods [Small Methods] 2024 Dec; Vol. 8 (12), pp. e2400395. Date of Electronic Publication: 2024 May 16.
Autor:
Canabarro BR; Program of Metallurgical and Materials Engineering- COPPE/Federal University of Rio de Janeiro, Rio de Janeiro, 68505, Brazil., Calderon S; Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA, 15213, USA., Letichevsky S; Chemical and Materials Engineering Department, Pontifícia Universidade Católica do Rio de Janeiro, Rio de Janeiro, 38097, Brazil., Jardim PM; Program of Metallurgical and Materials Engineering- COPPE/Federal University of Rio de Janeiro, Rio de Janeiro, 68505, Brazil., Ferreira P; International Iberian Nanotechnology Laboratory (INL), Braga, 4715-330, Portugal.; Department of Mechanical Engineering and IDMEC, Instituto Superior Técnico, University of Lisbon, Lisbon, 1049-001, Portugal.; Materials Science and Engineering Program - University of Texas, Austin, TX, 78712, USA.
Publikováno v:
Small (Weinheim an der Bergstrasse, Germany) [Small] 2024 Nov; Vol. 20 (47), pp. e2404777. Date of Electronic Publication: 2024 Aug 14.
Autor:
Ji, Guangyu1,2 (AUTHOR), Liu, Jia1 (AUTHOR), Zhao, Zhiqun1 (AUTHOR), Lan, Jie3 (AUTHOR), Yang, You4 (AUTHOR), Wang, Zheng5 (AUTHOR), Feng, Huijing6 (AUTHOR), Ji, Kai7 (AUTHOR), Jiang, Xiaofeng8 (AUTHOR), Xia, Huize1 (AUTHOR), Wei, Guangyao1 (AUTHOR), Zhang, Yajing1 (AUTHOR), Zhang, Yuhong1 (AUTHOR), Du, Xinlong1 (AUTHOR), Wang, Yawen9 (AUTHOR), Yang, Yuanyuan10 (AUTHOR), Liu, Zhaojian2 (AUTHOR), Zhang, Kai9 (AUTHOR) zhangkai@email.sdu.edu.cn, Mei, Qi6,11 (AUTHOR) qimei@tjh.tjmu.edu.cn, Sun, Rong1 (AUTHOR) sunrong@sdu.edu.cn
Publikováno v:
Advanced Science. 10/28/2024, Vol. 11 Issue 40, p1-11. 11p.
Autor:
Peters, Jonathan J. P.1,2,3 jonathan.peters@tcd.ie, Reed, Bryan W.4, Yu Jimbo5, Kanako Noguchi5, Müller, Karin H.6, Porter, Alexandra6, Masiel, Daniel J.4, Jones, Lewys1,2,3 lewys.jones@tcd.ie
Publikováno v:
Science. 8/2/2024, Vol. 385 Issue 6708, p549-553. 5p. 5 Diagrams.
Publikováno v:
Ultramicroscopy. 109(12)
Annular dark field scanning transmission electron microscopy imaging was recently applied to a catalyst consisting of gold nanoparticles on TiO(2) (110), showing directly that the gold atoms in small nanoparticles preferentially attach to specific si
Publikováno v:
Ultramicroscopy. 108(12)
A transmission electron microscope fitted with both pre-specimen and post-specimen spherical aberration correctors enables the possibility of aberration-corrected scanning confocal electron microscopy. Imaging modes available in this configuration ca