Zobrazeno 1 - 10
of 57
pro vyhledávání: '"S A Talukder"'
Publikováno v:
IEEE Access, Vol 7, Pp 81106-81120 (2019)
Physically unclonable functions (PUFs) are potential security blocks to generate unique and more secure keys in low-cost cryptographic applications. Dynamic random-access memory (DRAM) has been proposed as one of the promising candidates for generati
Externí odkaz:
https://doaj.org/article/cda57a0190f74db1ae0ba5f88ee8a5c1
Publikováno v:
IEEE Transactions on Information Forensics and Security. 16:4035-4049
Memory-based physical unclonable functions (mPUFs) are widely accepted as highly secure because of the unclonable and immutable nature of manufacturer process variations. Although numerous successful attacks have been proposed against PUFs, mPUFs are
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::86a2faf7d083589dc8b5885df652a2ae
https://doi.org/10.1109/tifs.2021.3101045
https://doi.org/10.1109/tifs.2021.3101045
Autor:
B. M. S. Bahar Talukder, Tauhidur Rahman, Imtiaz Rashid, Farah Ferdaus, Aubrey N. Beal, Paul Henny
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 29:14-23
True random number generation (TRNG) plays an important role in security applications and protocols. In this article, we propose an effective technique to generate a robust true random number using emerging, energy-efficient, nonvolatile, consumer-of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9abc84a0c832055c51a67e7ad08977a3
https://doi.org/10.1109/tvlsi.2020.3018998
https://doi.org/10.1109/tvlsi.2020.3018998
Publikováno v:
Cryptography, Vol 2, Iss 3, p 17 (2018)
Counterfeiting electronic components is a serious problem for the security and reliability of any electronic systems. Unfortunately, the number of counterfeit components has increased considerably after the introduction of horizontal semiconductor su
Externí odkaz:
https://doaj.org/article/158cdeef01ca4712981ca737ae120ef8
Publikováno v:
The Plant Genome, Vol 8, Iss 2 (2015)
Water stress is a fundamental problem for tall fescue [ (Schreb.) Darbysh.] cultivation in the south–central United States. Genetic improvement of tall fescue for water-stress tolerance is the key strategy for improving its persistence in the regio
Externí odkaz:
https://doaj.org/article/5ee05210252f42a3955a9b459e1fbdf0
Autor:
Marjan Ferdousi, Novia Nurain, Tanzila Choudhury, Mahmuda Naznin, A. B. M. Alim Al Islam, B. M. S. Bahar Talukder, Suraiya Tairin
Publikováno v:
Wireless Networks. 25:2651-2664
Wireless nanonetworks are not a simple extension of traditional communication networks at the nano-scale. Owing to being a completely new communication paradigm, existing research in this field is still at an embryonic stage. Furthermore, most of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ab2749587eaa904b23985f8063fb55cd
https://doi.org/10.1007/s11276-019-01977-w
https://doi.org/10.1007/s11276-019-01977-w
Publikováno v:
ISQED
The emerging magneto-resistive RAM (MRAM) has considerable potential to become a universal memory technology because of its several advantages: unlimited endurance, lower read/write latency, ultralow-power operation, high-density, and CMOS compatibil
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::201d31415df44439775e1efd77fa76d2
https://doi.org/10.1109/isqed51717.2021.9424346
https://doi.org/10.1109/isqed51717.2021.9424346
Many commercially available memory chips are fabricated worldwide in untrusted facilities. Therefore, a counterfeit memory chip can easily enter into the supply chain in different formats. Deploying these counterfeit memory chips into an electronic s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::78efd5e9c4453c17fb0f632c5bb7b820
Publikováno v:
HOST
Due to the globalization in the semiconductor supply chain, counterfeit dynamic random-access memory (DRAM) chips/modules have been spreading worldwide at an alarming rate. Deploying counterfeit DRAM modules into an electronic system can have severe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4f4a0eee37d71dee1b2c2604a879ca37
https://doi.org/10.1109/host45689.2020.9300125
https://doi.org/10.1109/host45689.2020.9300125