Zobrazeno 1 - 10
of 41
pro vyhledávání: '"Sérgio Campello Oliveira"'
Autor:
Adonias Luna Pereira da Silva, Sérgio Campello Oliveira, Gustavo Oliveira Cavalcanti, Manoel Alves de Almeida Neto, Maria Renata Nascimento dos Santos, Ignacio Llamas-Garro, Jung-Mu Kim, Gabriel de Freitas Fernandes, Eduardo Fontana
Publikováno v:
Journal of Microwaves, Optoelectronics and Electromagnetic Applications, Vol 20, Iss 1, Pp 158-172 (2021)
Abstract Recently a surface plasmon resonance (SPR) optical sensor, based on the Otto configuration — the Otto chip — has been developed. One essential step in the quality control of the fabrication process is characterization of the active regio
Externí odkaz:
https://doaj.org/article/8b7ea16d97284c11b28e8c652f608aa1
Autor:
Moemí Barbosa Lima, Alberto Casado Lordsleem Júnior, Ramiro Daniel Ballesteros Ruiz, Bruno José Torres Fernandes, Sérgio Campello Oliveira, Otávio José dos Santos
Publikováno v:
Mix Sustentável, Vol 6, Iss 2 (2020)
As fachadas são elementos da edificação que estão inexoravelmente expostas às intempéries, a inspeção segura e econômica das fachadas carece de novas tecnologias em contraponto ao tradicional processo de alpinismo industrial. Objetiva-se apr
Externí odkaz:
https://doaj.org/article/71bcb596539940c6a6f21e2bb5f0a611
Autor:
Bruno J. T. Fernandes, Leandro H. de S. Silva, Sérgio Campello Oliveira, George O. de A. Azevedo, Agostinho A. F. Júnior
Publikováno v:
Applied Sciences
Volume 11
Issue 6
Applied Sciences, Vol 11, Iss 2808, p 2808 (2021)
Volume 11
Issue 6
Applied Sciences, Vol 11, Iss 2808, p 2808 (2021)
The technological growth of the last decades has brought many improvements in daily life, but also concerns on how to deal with electronic waste. Electrical and electronic equipment waste is the fastest-growing rate in the industrialized world. One o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::761d584b6f1d0afd7de0f80d96584c97
Publikováno v:
Anais do 15. Congresso Brasileiro de Inteligência Computacional.
Quality control in electronic system manufacturing is achieved mainly through system testing. Device miniaturization and multilayer Printed Circuit Boards have increased the electronic circuit test complexity considerably and processes based on manua
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f99a308d3ce43de2d3575c00c6e315b
https://doi.org/10.21528/cbic2021-20
https://doi.org/10.21528/cbic2021-20
Autor:
Elisson Lima Gomes Silva, Rodrigo P. Monteiro, Rodrigo Melo, Lucas Matheus Rodrigues Santos, Sérgio Campello Oliveira, Paulo Brasil, Carmelo J. A. Bastos-Filho
Publikováno v:
Anais do 15. Congresso Brasileiro de Inteligência Computacional.
O objetivo deste trabalho é apresentar um estudo da aplicação de diversas arquiteturas de redes neurais convolucionais para automação do teste do desenho do pentágono aplicado no processo de avaliação cognitiva que busca identificar a presen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::abb7493ddfb2502a4653a84936d40afd
https://doi.org/10.21528/cbic2021-8
https://doi.org/10.21528/cbic2021-8
Autor:
Ramiro Daniel Ballesteros Ruiz, Alberto Casado Lordsleem Júnior, Sérgio Campello Oliveira, Bruno J. T. Fernandes
Publikováno v:
Lecture Notes in Civil Engineering ISBN: 9783030512941
In the diagnosis phase of pathological manifestations in facades, the visual inspection stage deserves special attention due to its inherent complexity (height, size, access difficulties and exposure conditions). In recent years, the use of deep lear
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3a3803ff96cd208a7f7a1adb67e1ffaa
https://doi.org/10.1007/978-3-030-51295-8_76
https://doi.org/10.1007/978-3-030-51295-8_76
Autor:
Lucindo José, Quintans-Júnior, George Rego, Albuquerque, Sérgio Campello, Oliveira, Robério Rodrigues, Silva
Publikováno v:
EXCLI Journal
EXCLI Journal; 19:Doc1322; ISSN 1611-2156
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f2e8b99d04aa8868559a56055a96637c
Publikováno v:
Anais do 14. Congresso Brasileiro de Inteligência Computacional.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b843bfe003d41906b8d1dbd64507d144
https://doi.org/10.21528/cbic2019-83
https://doi.org/10.21528/cbic2019-83
Autor:
Gustavo Oliveira Cavalcanti, Sérgio Campello Oliveira, Manoel Alves de Almeida Neto, Adonias Luna Pereira da Silva, Eduardo Fontana
Publikováno v:
2019 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference (IMOC).
The use of the Otto configuration, as an alternative to Kretschmann’s, in the constriction of Surface Plasmon Resonance (SPR) sensors is an underdeveloped research area. Recently, a version of an Otto based device, baptized as Otto chip, was manufa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b3e65680ca0916afb38238a69ed3a0fd
https://doi.org/10.1109/imoc43827.2019.9317596
https://doi.org/10.1109/imoc43827.2019.9317596
Autor:
George O. de A. Azevedo, Sérgio Campello Oliveira, Leandro H. de S. Silva, Byron L. D. Bezerra, Estanislau Lima, Bruno J. T. Fernandes
Publikováno v:
LA-CCI
Automated Optical Inspection (AOI), based on machine vision, has been widely used in the industry to perform quality control in various manufacturing segments. In addition to electrical testing, optical analysis is an important step for quality contr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6745bec1d300ac263ea8f10c5ea4c01a
https://doi.org/10.1109/la-cci47412.2019.9037036
https://doi.org/10.1109/la-cci47412.2019.9037036