Výsledky vyhledávání - "Sébastien Ordas"

Electromagnetic fault injection: the curse of flip-flops

Autor: Ludovic Guillaume-Sage, Philippe Maurine, Sébastien Ordas

Publikováno v: Journal of Cryptographic Engineering
Journal of Cryptographic Engineering, Springer, 2017, 7 (3), pp.183-197. ⟨10.1007/s13389-016-0128-3⟩

International audience; Electromagnetic (EM) waves have been recently pointed out as a medium for fault injection within integrated circuits (IC). Indeed, it has been experimentally demonstrated that an EM pulse (EMP), produced with a high-voltage pu

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0d2c85a1366b540024733c0f5ddb7e15
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01430913/file/Electromagnetic-fault-injection-the-curse-of-flip.pdf

Zobrazit plný text záznamu

Collision for Estimating SCA Measurement Quality and Related Applications

Autor: Yanis Linge, Sébastien Ordas, Mathieu Carbone, Philippe Maurine, Ibrahima Diop, Pierre Yvan Liardet

Publikováno v: Smart Card Research and Advanced Applications ISBN: 9783319312705
CARDIS
14th International Conference on Smart Card Research and Advanced Applications
CARDIS: Smart Card Research and Advanced Applications
CARDIS: Smart Card Research and Advanced Applications, Nov 2015, Bochum, Germany. pp.143-157, ⟨10.1007/978-3-319-31271-2_9⟩

International audience; If the Signal to Noise Ratio (SNR) is a figure of merit commonly used in many areas to gauge the quality of analogue measurements, its use in the context of Side-Channel Attacks (SCA) remains very difficult because the nature

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ad2db263d5de2c6e77a4f6f76b3456fa
https://doi.org/10.1007/978-3-319-31271-2_9

Zobrazit plný text záznamu

EM Injection: Fault Model and Locality

Autor: Sébastien Ordas, Philippe Maurine, Ludovic Guillaume-Sage

Publikováno v: Workshop on Fault Diagnosis and Tolerance in Cryptography
FDTC: Fault Diagnosis and Tolerance in Cryptography
FDTC: Fault Diagnosis and Tolerance in Cryptography, Sep 2015, Saint Malo, France. pp.3-13, ⟨10.1109/FDTC.2015.9⟩
FDTC

International audience; EM injection recently emerged as an effective medium for fault injection. This paper presents an analysis of the IC susceptibility to EM pulses. It highlights that faults produced by EM pulse injection are not timing faults bu

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a0443e28b43510bb367e38822039558b
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01319078

Zobrazit plný text záznamu

Evidence of a larger EM-induced fault model

Autor: Ludovic Guillaume-Sage, Karim Tobich, Philippe Maurine, Sébastien Ordas, Jean-Max Dutertre

Publikováno v: 13th Smart Card Research and Advanced Application Conference
CARDIS: Smart Card Research and Advanced Applications
CARDIS: Smart Card Research and Advanced Applications, Nov 2014, Paris, France. pp.245-259, ⟨10.1007/978-3-319-16763-3_15⟩
Smart Card Research and Advanced Applications ISBN: 9783319167626
CARDIS

International audience; Electromagnetic waves have been recently pointed out as a medium for fault injection within circuits featuring cryptographic mod- ules. Indeed, it has been experimentally demonstrated by A. Dehbaoui et al. (Injection of transi

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::64efeea27e691b43ae4d3cf876d569f5
https://hal-emse.ccsd.cnrs.fr/emse-01099037

Zobrazit plný text záznamu

A frequency leakage model for SCA

Autor: Sébastien Tiran, Philippe Maurine, Sébastien Ordas, Yannick Teglia, Michel Agoyan

Publikováno v: IEEE International Symposium on Hardware-Oriented Security and Trust
HOST: Hardware-Oriented Security and Trust
HOST: Hardware-Oriented Security and Trust, May 2014, Arlington, VA, United States. pp.97-100, ⟨10.1109/HST.2014.6855577⟩
HOST

International audience; This paper introduces a leakage model in the frequency domain to enhance the efficiency of Side Channel Attacks of CMOS circuits. While usual techniques are focused on noise removal around clock harmonics, we show that the act

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c12d9c8260b0ea1e148d4f31a70f89e6
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01096058

Zobrazit plný text záznamu

Efficiency of the RDVFS countermeasure

Autor: Sébastien Ordas, Sébastien Tiran, Gilles R. Ducharme, Philippe Maurine, Mathieu Carbone

Publikováno v: 2014 IEEE Faible Tension Faible Consommation.

The use of Dynamic Voltage and Frequency Scaling technique (DVFS) in Systems-on-Chip is becoming more and more common. This technique, re-named RDVFS for the occasion, has recently been proposed as a countermeasure against Side Channel Attacks (SCA)

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::18322b5f38a43f12b3d7d480093ed50f
https://doi.org/10.1109/ftfc.2014.6828600

Zobrazit plný text záznamu

Vyhledávací nástroje:

Upřesnit hledání