Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Sébastien MARBACH"'
Autor:
Paul C. Montgomery, Manuel Flury, Freddy Anstotz, Sébastien Marbach, Christophe Cordier, Jérémy Bartringer, Husneni Mukhtar, Audrey Leong-Hoï, Anne Rubin, Anastasiia Shpiruk, Mireille Del Nero, Rémi Barillon
Publikováno v:
ACS Omega
ACS Omega, 2023, 8 (12), pp.10643-10655. ⟨10.1021/acsomega.2c07007⟩
ACS Omega, 2023, 8 (12), pp.10643-10655. ⟨10.1021/acsomega.2c07007⟩
Functional materials are challenging to characterize because of the presence of small structures and inhomogeneous materials. If interference microscopy was initially developed for use for the optical profilometry of homogeneous, static surfaces, it
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6e50b10e351e661fad699a77401c36d8
https://hal.science/hal-04035523/document
https://hal.science/hal-04035523/document
Publikováno v:
Imagerie optique non conventionnelles pour la biologie
Imagerie optique non conventionnelles pour la biologie, ISTE Editions, 2023, 978-1-178948-132-7
Imageries optiques non conventionnelles pour la biologie ISBN: 9781789481327
Imagerie optique non conventionnelles pour la biologie, ISTE Editions, 2023, 978-1-178948-132-7
Imageries optiques non conventionnelles pour la biologie ISBN: 9781789481327
La microscopie interférométrique est aujourd’hui une technique mature de métrologie optique sans contact permettant d’accéder à diverses informations en surface ou volume. Ce chapitre décrit les principes, la théorie sous-jacente, les algo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e1b82d0eabd9bf3603020f0b63f4b7a7
https://hal.science/hal-03974492
https://hal.science/hal-03974492
Autor:
Sébastien Marbach, Rémy Claveau, Florie Ogor, Christophe Cordier, Jesse Schiffler, Paul Montgomery, Manuel Flury
Publikováno v:
Optics and Lasers in Engineering
Optics and Lasers in Engineering, 2023, 162, pp.107402. ⟨10.1016/j.optlaseng.2022.107402⟩
Optics and Lasers in Engineering, 2023, 162, pp.107402. ⟨10.1016/j.optlaseng.2022.107402⟩
International audience; Laser marking is a well-established advanced technology for changing the color properties of an object. The spectral response or color information induced by the laser is generally measured with a spectrometer or an ellipsomet
Publikováno v:
SPIE Optical Metrology 2021
SPIE Optical Metrology 2021, Jun 2021, En ligne, France. 2021, ⟨10.1117/12.2593011⟩
SPIE Optical Metrology 2021, Jun 2021, En ligne, France. 2021, ⟨10.1117/12.2593011⟩
The large spot size of a few mm2 with spectrometers and a few thousand µm2 with ellipsometers means that classical spectroscopic characterization is limited to that of bulk materials. In the development of more recent heterogeneous materials in whic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::851eca971ecddadd1549126c74861a5c
https://hal.archives-ouvertes.fr/hal-03325501
https://hal.archives-ouvertes.fr/hal-03325501
Publikováno v:
physica status solidi (a)
physica status solidi (a), 2021, 2000683, ⟨10.1002/pssa.202000683⟩
physica status solidi (a), Wiley, 2021, 2000683, ⟨10.1002/pssa.202000683⟩
physica status solidi (a), 2021, 2000683, ⟨10.1002/pssa.202000683⟩
physica status solidi (a), Wiley, 2021, 2000683, ⟨10.1002/pssa.202000683⟩
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ebfa9e08f9943ccf4b0758379da20db6
https://hal.science/hal-03228227
https://hal.science/hal-03228227
Autor:
Sébastien Marbach, Jesse Schiffler, Paul Montgomery, Manuel Flury, Fangting Wang, Rémy Claveau
Publikováno v:
Optics Letters
Optics Letters, Optical Society of America-OSA Publishing, 2021, 46 (4), ⟨10.1364/OL.413036⟩
Optics Letters, 2021, 46 (4), ⟨10.1364/OL.413036⟩
Optics Letters, Optical Society of America-OSA Publishing, 2021, 46 (4), ⟨10.1364/OL.413036⟩
Optics Letters, 2021, 46 (4), ⟨10.1364/OL.413036⟩
Fourier analysis of interferograms captured in white light interference microscopy is proposed for performing simultaneous local spectral and topographic measurements at high spatial resolution over a large field of view. The technique provides a wea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1c8b84e32183e62e53d6fec0f5082b7d
https://hal.archives-ouvertes.fr/hal-03238134/document
https://hal.archives-ouvertes.fr/hal-03238134/document
Autor:
Paul Montgomery, Sébastien Marbach, Christophe Cordier, Remy Claveau, Manuel Flury, Thierry Engel
Publikováno v:
Proceedings of SPIE
SPIE Photonics Europe
SPIE Photonics Europe, SPIE, Apr 2020, Strasbourg (on line), France. pp.113521B-1, ⟨10.1117/12.2555929⟩
SPIE Photonics Europe
SPIE Photonics Europe, SPIE, Apr 2020, Strasbourg (on line), France. pp.113521B-1, ⟨10.1117/12.2555929⟩
International audience; Interference microscopy is a non-destructive full-field imaging method, mainly used to measure the surface topography of different samples. In this work, two designs for improving the signal quality are described. The first co
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3a3adf0ed0571555077e924961683b5a
https://hal.archives-ouvertes.fr/hal-03100903
https://hal.archives-ouvertes.fr/hal-03100903
Publikováno v:
Optical Measurement Systems for Industrial Inspection XI
Optical Measurement Systems for Industrial Inspection XI, SPIE, Jun 2019, Munich, Germany. pp.26, ⟨10.1117/12.2526086⟩
Optical Measurement Systems for Industrial Inspection XI, SPIE, Jun 2019, Munich, Germany. pp.26, ⟨10.1117/12.2526086⟩
Observation of nanoscale elements through an optical microscope is often restricted by the resolving power of the optical system. Indeed, a white-light microscope allows the visualisation of objects having a size that is only just greater than half o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ee4b88392b6ecc7de997ae312a336db7
https://hal.science/hal-02391569
https://hal.science/hal-02391569