Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Sébastien Haendler"'
Autor:
Owen Gauthier, Sébastien Haendler, Ronan Beucher, Patrick Scheer, Quentin Rafhay, Christoforos Theodorou
Publikováno v:
2023 35th International Conference on Microelectronic Test Structure (ICMTS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::93cd08aa553fee6afe8d613e5d7df4ea
https://doi.org/10.1109/icmts55420.2023.10094087
https://doi.org/10.1109/icmts55420.2023.10094087
Autor:
Owen Gauthier, Sébastien Haendler, Patrick Scheer, Alexandre Vernhet, Quentin Rafhay, Christoforos Theodorou
Publikováno v:
Solid-State Electronics. 194:108320
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8499219cb6a9bbeafd5c440cbb084384
https://doi.org/10.1016/j.sse.2022.108320
https://doi.org/10.1016/j.sse.2022.108320