Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Sébastien Haendler"'
Autor:
Owen Gauthier, Sébastien Haendler, Ronan Beucher, Patrick Scheer, Quentin Rafhay, Christoforos Theodorou
Publikováno v:
2023 35th International Conference on Microelectronic Test Structure (ICMTS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::93cd08aa553fee6afe8d613e5d7df4ea
https://doi.org/10.1109/icmts55420.2023.10094087
https://doi.org/10.1109/icmts55420.2023.10094087
Autor:
Owen Gauthier, Sébastien Haendler, Patrick Scheer, Alexandre Vernhet, Quentin Rafhay, Christoforos Theodorou
Publikováno v:
Solid-State Electronics. 194:108320
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8499219cb6a9bbeafd5c440cbb084384
https://doi.org/10.1016/j.sse.2022.108320
https://doi.org/10.1016/j.sse.2022.108320
Publikováno v:
Applied Physics Letters; 6/5/2023, Vol. 122 Issue 23, p1-5, 5p
Publikováno v:
2015 IEEE International Reliability Physics Symposium; 2015, p1-30, 30p
Autor:
Cochet, Martin, Pelloux-Prayer, Bertrand, Saligane, Mehdi, Clerc, Sylvain, Roche, Philippe, Autran, Jean-Luc, Sylvester, Dennis
Publikováno v:
2014 SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S); 2014, p1-2, 2p
Selected, peer reviewed papers from the 9th European Conference on Residual Stresses, ECRS-9, July 7-10, 2014, Troyes, France
