Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Ryzhenko DS"'
Autor:
Kochervinskii VV; Laboratory of Technologies of Polymer Ferroelectrics, Bauman Moscow State Technical University, 141005 Moscow, Russia., Buryanskaya EL; Laboratory of Technologies of Polymer Ferroelectrics, Bauman Moscow State Technical University, 141005 Moscow, Russia.; Laboratory of Physics of Oxide Ferroelectrics, Department of Materials Science of Semiconductors and Dielectrics, National University of Science and Technology MISIS, 119049 Moscow, Russia., Osipkov AS; Laboratory of Technologies of Polymer Ferroelectrics, Bauman Moscow State Technical University, 141005 Moscow, Russia., Ryzhenko DS; Laboratory of Technologies of Polymer Ferroelectrics, Bauman Moscow State Technical University, 141005 Moscow, Russia., Kiselev DA; Laboratory of Physics of Oxide Ferroelectrics, Department of Materials Science of Semiconductors and Dielectrics, National University of Science and Technology MISIS, 119049 Moscow, Russia., Lokshin BV; Division of Physical-Chemical Research Methods, A.N. Nesmeyanov Institute of Organoelement Compounds RAS, 119334 Moscow, Russia., Zvyagina AI; A.N. Frumkin Institute of Physical Chemistry and Electrochemistry RAS, 119991 Moscow, Russia., Kirakosyan GA; A.N. Frumkin Institute of Physical Chemistry and Electrochemistry RAS, 119991 Moscow, Russia.; Laboratory of Coordination Chemistry of Alkali and Rare Metals, N.S. Kurnakov Institute of General and Inorganic Chemistry RAS, 119991 Moscow, Russia.
Publikováno v:
Polymers [Polymers (Basel)] 2024 Jan 15; Vol. 16 (2). Date of Electronic Publication: 2024 Jan 15.
Autor:
Voronin AS; Department of Molecular Electronics, Federal Research Center «Krasnoyarsk Scientific Center», Siberian Branch, Russian Academy of Sciences (FRC KSC SB RAS), 660036 Krasnoyarsk, Russia.; School of Engineering and Construction, Siberian Federal University, 660041 Krasnoyarsk, Russia.; Laboratory of EMI Shielding Materials, Bauman Moscow State Technical University, 105005 Moscow, Russia., Fadeev YV; Department of Molecular Electronics, Federal Research Center «Krasnoyarsk Scientific Center», Siberian Branch, Russian Academy of Sciences (FRC KSC SB RAS), 660036 Krasnoyarsk, Russia.; School of Engineering and Construction, Siberian Federal University, 660041 Krasnoyarsk, Russia., Makeev MO; Laboratory of EMI Shielding Materials, Bauman Moscow State Technical University, 105005 Moscow, Russia., Mikhalev PA; Laboratory of EMI Shielding Materials, Bauman Moscow State Technical University, 105005 Moscow, Russia., Osipkov AS; Laboratory of EMI Shielding Materials, Bauman Moscow State Technical University, 105005 Moscow, Russia., Provatorov AS; Laboratory of EMI Shielding Materials, Bauman Moscow State Technical University, 105005 Moscow, Russia., Ryzhenko DS; Laboratory of EMI Shielding Materials, Bauman Moscow State Technical University, 105005 Moscow, Russia., Yurkov GY; Laboratory of EMI Shielding Materials, Bauman Moscow State Technical University, 105005 Moscow, Russia.; Laboratory of Reinforced Plastics, N.N. Semenov Federal Research Center of Chemical Physics, Russian Academy of Sciences, 119991 Moscow, Russia., Simunin MM; Department of Molecular Electronics, Federal Research Center «Krasnoyarsk Scientific Center», Siberian Branch, Russian Academy of Sciences (FRC KSC SB RAS), 660036 Krasnoyarsk, Russia.; School of Non-Ferrous Metals and Materials Science, Siberian Federal University, 660041 Krasnoyarsk, Russia.; Department of Aircraft, Reshetnev Siberian University Science and Technology, 660037 Krasnoyarsk, Russia., Karpova DV; Department of Molecular Electronics, Federal Research Center «Krasnoyarsk Scientific Center», Siberian Branch, Russian Academy of Sciences (FRC KSC SB RAS), 660036 Krasnoyarsk, Russia., Lukyanenko AV; School of Engineering Physics and Radio Electronics, Siberian Federal University, 660041 Krasnoyarsk, Russia.; Laboratory of Radiospectroscopy and Spintronics, L.V. Kirensky Institute of Physics, Siberian Branch, Russian Academy of Sciences, 660036 Krasnoyarsk, Russia., Kokh D; Department of Molecular Electronics, Federal Research Center «Krasnoyarsk Scientific Center», Siberian Branch, Russian Academy of Sciences (FRC KSC SB RAS), 660036 Krasnoyarsk, Russia.; Scientific and Training Center of Space Research and High Technologies Institute, Reshetnev Siberian University Science and Technology, 660037 Krasnoyarsk, Russia., Bainov DD; Laboratory for Radiation and Plasma Technologies, Tomsk Polytechnic University, 634050 Tomsk, Russia.; Laboratory of Radiophotonics, V.E. Zuev Institute of Atmospheric Optics, Siberian Branch, Russian Academy of Science, 634055 Tomsk, Russia., Tambasov IA; Laboratory of Photonics of Molecular Systems, L.V. Kirensky Institute of Physics, Siberian Branch, Russian Academy of Sciences, 660036 Krasnoyarsk, Russia.; LLC Research and Production Company 'Spectehnauka', 660043 Krasnoyarsk, Russia., Nedelin SV; School of Engineering Physics and Radio Electronics, Siberian Federal University, 660041 Krasnoyarsk, Russia.; LLC Research and Production Company 'Spectehnauka', 660043 Krasnoyarsk, Russia., Zolotovsky NA; School of Engineering Physics and Radio Electronics, Siberian Federal University, 660041 Krasnoyarsk, Russia.; LLC Research and Production Company 'Spectehnauka', 660043 Krasnoyarsk, Russia., Khartov SV; Department of Molecular Electronics, Federal Research Center «Krasnoyarsk Scientific Center», Siberian Branch, Russian Academy of Sciences (FRC KSC SB RAS), 660036 Krasnoyarsk, Russia.
Publikováno v:
Materials (Basel, Switzerland) [Materials (Basel)] 2022 Feb 15; Vol. 15 (4). Date of Electronic Publication: 2022 Feb 15.