Zobrazeno 1 - 10
of 67
pro vyhledávání: '"Ryukou Kato"'
Autor:
Miho Shimada, Norio Nakamura, Tsukasa Miyajima, Yosuke Honda, Takashi Obina, Ryukou Kato, Masafumi Fukuda, Nora P. Norvell, Olga Tanaka, Hiroshi Sakai
Publikováno v:
Physical Review Accelerators and Beams, Vol 26, Iss 3, p 030102 (2023)
The compact energy recovery linac (cERL) has been developed for industrial applications since 2017. Applications such as free electron laser require a compressed beam with a small energy spread and transverse emittance. The typical operation energy o
Externí odkaz:
https://doaj.org/article/0f7dde63f18b4e43a0f2818662b85064
Autor:
Akinori Irizawa, Masaki Fujimoto, Keigo Kawase, Ryukou Kato, Hidenori Fujiwara, Atsushi Higashiya, Salvatore Macis, Luca Tomarchio, Stefano Lupi, Augusto Marcelli, Shigemasa Suga
Publikováno v:
Condensed Matter, Vol 5, Iss 2, p 38 (2020)
Using the unique characteristics of the free-electron-laser (FEL), we successfully performed high-sensitivity spectral imaging of different materials in the terahertz (THz) and far-infrared (FIR) domain. THz imaging at various wavelengths was achieve
Externí odkaz:
https://doaj.org/article/ac9920da303345078040269b75705450
Autor:
Shigeru Kashiwagi, Ryukou Kato, Akihito Mihara, Takanori Noda, Goro Isoyama, Kimichika Tsuchiya, Tatsuro Shioya, Shigeru Yamamoto
Publikováno v:
Physical Review Special Topics. Accelerators and Beams, Vol 12, Iss 12, p 120703 (2009)
The edge-focusing (EF) wiggler, which produces the strong field gradient for transverse focusing incorporated with the normal wiggler field, has been fabricated to evaluate its performance rigorously with the magnetic field measurement. It is a five-
Externí odkaz:
https://doaj.org/article/31bc323806ab40cc8983de95f7465f63
Publikováno v:
Journal of Micro/Nanopatterning, Materials, and Metrology. 21
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fa7b5a9115fe4baac9fc7ca2953494b4
https://doi.org/10.1117/1.jmm.21.2.021210
https://doi.org/10.1117/1.jmm.21.2.021210
Autor:
Norio Nakamura, Ryukou Kato, Hiroshi Sakai, Kimichika Tsuchiya, Yasunori Tanimoto, Yosuke Honda, Tsukasa Miyajima, Miho Shimada, Takashi Obina, Hiroshi Kawata
Publikováno v:
Optical and EUV Nanolithography XXXV.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ee594e6e4f7db1a317b221e731a4b318
https://doi.org/10.1117/12.2613617
https://doi.org/10.1117/12.2613617
Autor:
Norio Nakamura, Ryukou Kato, Hiroshi Sakai, Kimichika Tsuchiya, Yasunori Tanimoto, Yosuke Honda, Tsukasa Miyajima, Miho Shimada, Takanori Tanikawa, Olga A. Tanaka, Takashi Obina, Hiroshi Kawata
Publikováno v:
Japanese Journal of Applied Physics. 62:SG0809
The development of a high-power EUV light source is very important in EUV lithography to overcome the stochastic effects for higher throughput and higher numerical aperture (NA) in the future. We have designed and studied a high-power EUV free-electr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6c43762048bee1e4f2cb5a608873f585
https://doi.org/10.35848/1347-4065/acc18c
https://doi.org/10.35848/1347-4065/acc18c
Autor:
Tsukasa Miyajima, Yasunori Tanimoto, Norio Nakamura, Ryukou Kato, Kimichika Tsuchiya, Yosuke Honda, Hiroshi Sakai, Hiroshi Kawata, Miho Shimada
Publikováno v:
Extreme Ultraviolet Lithography 2020.
An EUV-FEL is one of the promising candidates for the future high power EUV light source of more than 1 kW. While the design study on the FEL light source has been progressed, a most important milestone should be a real demonstration of the high repe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::96a15e26553231c13298cfac6c0b4166
https://doi.org/10.1117/12.2573121
https://doi.org/10.1117/12.2573121
Autor:
Stefano Lupi, Keigo Kawase, Shigemasa Suga, Luca Tomarchio, Augusto Marcelli, Salvatore Macis, Ryukou Kato, Hidenori Fujiwara, Akinori Irizawa, Masaki Fujimoto, Atsushi Higashiya
Publikováno v:
Condensed Matter, Vol 5, Iss 38, p 38 (2020)
Condensed Matter
Volume 5
Issue 2
Condensed Matter
Volume 5
Issue 2
Using the unique characteristics of the free-electron-laser (FEL), we successfully performed high-sensitivity spectral imaging of different materials in the terahertz (THz) and far-infrared (FIR) domain. THz imaging at various wavelengths was achieve
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3db08abc1dd5ec8c723c753b2708ec60
https://www.mdpi.com/2410-3896/5/2/38
https://www.mdpi.com/2410-3896/5/2/38
Autor:
Norio Nakamura, Kimichika Tsuchiya, Hiroshi Sakai, Hiroshi Kawata, Ryukou Kato, Yasunori Tanimoto, Tsukasa Miyajima, Yosuke Honda, Miho Shimada
Publikováno v:
OSA High-brightness Sources and Light-driven Interactions Congress 2020 (EUVXRAY, HILAS, MICS).
A high repetition rate EUV-FEL is one of the promising candidates for the future high power EUV light source more than 1 kW for future lithography. The design work on the FEL light source and the stepwise development procedure have been proposed else
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::342c9ef85546bf43332affd009a27256
https://doi.org/10.1364/euvxray.2020.eth2a.2
https://doi.org/10.1364/euvxray.2020.eth2a.2
Autor:
Ryota Takai, Hidehiko Yashiro, Miho Shimada, Takashi Uchiyama, Norio Nakamura, Tatsuro Shioya, Nao Higashi, Yasunori Tanimoto, Demin Zhou, Akira Ueda, Kimichika Tsuchiya, Ryukou Kato, Takashi Nogami, Takako Miura, Hidenori Sagehashi, Ryoichi Hajima, Masahiro Adachi, Masafumi Fukuda, Yosuke Honda, Hiroshi Sakai, Tsukasa Miyajima, Masayuki Kakehata, Tadatake Sato, Shinya Nagahashi, Shu Eguchi, Takashi Obina, Masahiro Yamamoto, Kazuyuki Nigorikawa, Olga Tanaka
Publikováno v:
Review of Scientific Instruments. 92:113101
The mid-infrared range is an important spectrum range where materials exhibit a characteristic response corresponding to their molecular structure. A free-electron laser (FEL) is a promising candidate for a high-power light source with wavelength tun
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::115c6be3550b995b7a13390d7258d478
https://doi.org/10.1063/5.0072511
https://doi.org/10.1063/5.0072511