Zobrazeno 1 - 10
of 12
pro vyhledávání: '"Ryuichiro Tamochi"'
Autor:
Jiro Usukura, Akihiro Narita, Tomoharu Matsumoto, Eiji Usukura, Takeshi Sunaoshi, Syunya Watanabe, Yusuke Tamba, Yasuhira Nagakubo, Takashi Mizuo, Junzo Azuma, Masako Osumi, Kazutaka Nimura, Ryuichiro Tamochi, Yoichi Ose
Publikováno v:
Scientific Reports, Vol 11, Iss 1, Pp 1-10 (2021)
Abstract The scanning electron microscope (SEM) has been reassembled into a new type of cryo-electron microscope (cryo-TSEM) by installing a new cryo-transfer holder and anti-contamination trap, which allowed simultaneous acquisition of both transmis
Externí odkaz:
https://doaj.org/article/b8e0ce76230b4113a0fa5d7ebebda2c7
Autor:
Akihiro Narita, Takeshi Sunaoshi, Yoichi Ose, Yusuke Tamba, Masako Osumi, Ryuichiro Tamochi, Junzo Azuma, Tomoharu Matsumoto, Yasuhira Nagakubo, Syunya Watanabe, Kazutaka Nimura, Jiro Usukura, Takashi Mizuo, Eiji Usukura
Publikováno v:
Scientific Reports
Scientific Reports, Vol 11, Iss 1, Pp 1-10 (2021)
Scientific Reports, Vol 11, Iss 1, Pp 1-10 (2021)
The scanning electron microscope (SEM) has been reassembled into a new type of cryo-electron microscope (cryo-TSEM) by installing a new cryo-transfer holder and anti-contamination trap, which allowed simultaneous acquisition of both transmission imag
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1144bedb9aa4eb9dee0a6a67717080ce
https://doi.org/10.1038/s41598-021-00979-z
https://doi.org/10.1038/s41598-021-00979-z
Autor:
Masako Osumi, Tomoharu Matsumoto, Takashi Mizuo, Junzo Azuma, Takeshi Sunaoshi, Yasuhira Nagakubo, Ryuichiro Tamochi, Akihiro Narita, Syunya Watanabe, Kazutaka Nimura, Yoichi Ose, Eiji Usukura, Jiro Usukura, Yusuke Tamba
A new type of cryo-electron microscopy (cryo-S(T)EM) technique made possible by installing a new cryo-transfer holder and an anti-contamination trap on a scanning electron microscope (Hitachi SU9000) allowed simultaneous collection of both transmissi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ef64fc2465a32bdc5e112b3165b32cc0
https://doi.org/10.21203/rs.3.rs-523739/v1
https://doi.org/10.21203/rs.3.rs-523739/v1
Publikováno v:
Biological Field Emission Scanning Electron Microscopy ISBN: 9781118663233
Biological Field Emission Scanning Electron Microscopy
Biological Field Emission Scanning Electron Microscopy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5c28297ba5a19a48b97268839d0e6c56
https://doi.org/10.1002/9781118663233.ch3
https://doi.org/10.1002/9781118663233.ch3
Autor:
Masako Osumi, Junzo Azuma, Akihiro Narita, Yusuke Tamba, Tomoharu Matsumoto, Eiji Usukura, Takeshi Sunaoshi, Jiro Usukura, Yoichi Ose, Yasuhira Nagakubo, Ryuichiro Tamochi
Publikováno v:
Microscopy and Microanalysis. 24:1158-1159
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c594a2870d13f273bd25c18facffbb21
https://doi.org/10.1017/s143192761800627x
https://doi.org/10.1017/s143192761800627x
Autor:
Ichiko Misumi, Osamu Sato, Shin-ichi Kitamura, Masatoshi Yasutake, Ryohei Kokawa, Nobuo Kojima, Toru Fujii, Jun-ichiro Kitta, Tomizo Kurosawa, Ryuichiro Tamochi, Satoshi Gonda
Publikováno v:
Measurement Science and Technology. 18:803-812
An intercomparison of nanometric lateral scales, which are special one-dimensional (1D) grating standards with sub-hundred-nanometre pitches, among a deep-ultraviolet (DUV) laser diffractometer, a critical dimension scanning electron microscope (CD-S
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::42ef347481f85a5cd244382ec030e288
https://doi.org/10.1088/0957-0233/18/3/032
https://doi.org/10.1088/0957-0233/18/3/032
Autor:
Yasuhira Nagakubo, Ryuichiro Tamochi, Akihiro Narita, Tomoharu Matsumoto, Yoichi Ose, Masako Osumi, Junzo Azuma, Takeshi Sunaoshi, Jiro Usukura, Eiji Usukura, Yusuke Tamba
Publikováno v:
Microscopy. 66:i6-i6
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ceea80b85166b0c7751c882b0a5a6026
https://doi.org/10.1093/jmicro/dfx040
https://doi.org/10.1093/jmicro/dfx040
Autor:
Masako Osumi, Shingo Tahara, Nobuhito Nango, Ryuichiro Tamochi, Nguyen Le Quynh Anh, Yosuke Shida, Wataru Ogasawara, Minaho Fujiwara, Akinari Morikawa, Hitoshi Okada
Publikováno v:
Microscopy. 65:i28.1-i28
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::449e9239c8e42f35eecb2b6596d2ebdc
https://doi.org/10.1093/jmicro/dfw060
https://doi.org/10.1093/jmicro/dfw060
Publikováno v:
Practica Oto-Rhino-Laryngologica. 87:123-129
This study estimated the depth of imprint on the tectorial membrane using a new three dimensional measurement system. The tectorial membrane covers the surface of the organ of Corti. The tips of the sensory cell hairs are firmly embedded in the under
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0de7538fdd0a272f04024f23feb79236
https://doi.org/10.5631/jibirin.87.123
https://doi.org/10.5631/jibirin.87.123
Autor:
Hirohisa Okushima, Yasushi Kuroda, Toshihiko Onozuka, Toshie Yaguchi, Kaoru Umemura, Kenji Watanabe, Isao Kawata, Bart Rijpers, Ryuichiro Tamochi, Norio Hasegawa
Publikováno v:
SPIE Proceedings.
This paper presents a novel method of FIB (FIB: focused ion beam) sample preparation to accurately evaluate critical dimensions and profiles of ArF photo resist patterns without the use of a protective coating on the photo resist. In order to accompl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3d700f36b48ea0f7a54599c3920b0bad
https://doi.org/10.1117/12.655984
https://doi.org/10.1117/12.655984