Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Ryo Yumiba"'
Autor:
Masayoshi Ishikawa, Ryo Yumiba, Masanori Ouchi, Hiroyuki Shindo, Shinichi Shinoda, Yasutaka Toyoda, Masayuki Izawa
Publikováno v:
Metrology, Inspection, and Process Control for Microlithography XXXIV.
In the drive toward sub-10-nm semiconductor devices, manufacturers have been developing advanced lithography technologies such as extreme ultraviolet lithography and multiple patterning. However, these technologies can cause unexpected defects, and a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8dd567516b6ccea9fa697b8cac1c4b68
https://doi.org/10.1117/12.2551456
https://doi.org/10.1117/12.2551456
Autor:
Shigetoshi Sakimura, Masayuki Izawa, Shinichi Shinoda, Yasutaka Toyoda, Hiroyuki Shindo, Ryo Yumiba, Masayoshi Ishikawa
Publikováno v:
Metrology, Inspection, and Process Control for Microlithography XXXIII.
With the miniaturization of devices, hot spots caused by wafer topology are becoming a problem in addition to hot spots resulting from design, mask and wafer process, and hot spot evaluation of a wide area in a chip is becoming required. Although DBM
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1a23f0f7d55beabb728afb5bb2a28d2d
https://doi.org/10.1117/12.2514898
https://doi.org/10.1117/12.2514898
Autor:
Hironobu Fujiyoshi, Ryo Yumiba
Publikováno v:
IPSJ Transactions on Computer Vision and Applications. 6:103-110
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::40825e5e1019a3467c26f2b4dc14f56c
https://doi.org/10.2197/ipsjtcva.6.103
https://doi.org/10.2197/ipsjtcva.6.103
Deep learning's impact on contour extraction for Design Based Metrology and Design Based Inspection.
Autor:
Ryo Yumiba, Masayoshi Ishikawa, Shinichi Shinoda, Shigetoshi Sakimura, Yasutaka Toyoda, Hiroyuki Shindo, Masayuki Izawa
Publikováno v:
Proceedings of SPIE; 1/22/2019, Vol. 10959, p1-9, 9p
Autor:
Shuyang Dou, Shinichi Shinoda, Masayoshi Ishikawa, Ryo Yumiba, Shigetoshi Sakimura, Masanori Ouchi, Yasutaka Toyoda, Hiroyuki Shindo, Masayuki Izawa
Publikováno v:
Proceedings of SPIE; 1/22/2019, Vol. 10959, p1-8, 8p
Publikováno v:
Systems and Computers in Japan. 37:101-112
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2ba6caf076ffb94924c781f842c32e1d
https://doi.org/10.1002/scj.10160
https://doi.org/10.1002/scj.10160
Publikováno v:
CVPR Workshops
In this paper, we propose a method for compensating for motion features that are outside a given viewing angle by using a regression estimate that is based on a correlation between the motion features from human bodies deficient visually, when recogn
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cebb72a9ce6674ac74f4b61fd9b5fb2f
https://doi.org/10.1109/cvprw.2013.87
https://doi.org/10.1109/cvprw.2013.87
Publikováno v:
WACV
Background subtraction is a common method for detecting moving objects, but it is yet a difficult problem to distinguish moving objects from backgrounds when these backgrounds change significantly. Hence, we propose a method for detecting moving obje
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::809c351c07324f7eb4fca54954a1918a
https://doi.org/10.1109/wacv.2011.5711525
https://doi.org/10.1109/wacv.2011.5711525