Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Ryo Mimura"'
Autor:
Maxime G. Lemaitre, Ralf Jede, Joel Fridmann, Ryo Mimura, Jason E. Sanabia, S. Bauerdick, Brent P. Gila, Bill R. Appleton, Sefaattin Tongay, Paul Mazarov, L. Bruchhaus
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 272:153-157
Materials modification and nanofabrication results are reported from the use of a new multi-ion beam lithography and processing system developed by the University of Florida (UF) and Raith Inc. The UF system utilizes liquid metal alloy ion sources an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bc6e0eff5782283a1e1531050c215ea5
https://doi.org/10.1016/j.nimb.2011.01.054
https://doi.org/10.1016/j.nimb.2011.01.054
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 210:104-107
Three-dimensional Rutherford backscattering (RBS) analyses have been achieved in the nanometer range for both lateral and vertical resolution using a 200 kV focused ion beam (FIB) system. The ion-optical design of the FIB microprobe RBS analysis syst
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::91161cf31adfb7e9e96eaecee16336d4
https://doi.org/10.1016/s0168-583x(03)01044-9
https://doi.org/10.1016/s0168-583x(03)01044-9
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 181:335-339
Localized beam-processed areas using chemical reactions induced by a 30 keV Ga + focused ion beam (FIB) with and without I2 (etching) and (CH3)3CH3C5H5Pt gases (Pt deposition) have been analyzed using a 300 keV Be 2+ microprobe with a beam spot size
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0ccf2ed3ab6013ec8c79ff6682a899ed
https://doi.org/10.1016/s0168-583x(01)00491-8
https://doi.org/10.1016/s0168-583x(01)00491-8
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 181:44-48
A time of flight (TOF) Rutherford backscattering (RBS) system with a nano-probe line has been designed and installed. A medium energy (100–400 keV) nano-probe with beam pulsing and multiscaling detecting techniques was used to obtain enhanced detec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::304f176cd6ed6f32a3d1a6c25b4703c0
https://doi.org/10.1016/s0168-583x(01)00553-5
https://doi.org/10.1016/s0168-583x(01)00553-5
Autor:
Ryo Mimura
Publikováno v:
Journal of the Japanese Association for Petroleum Technology. 61:287-291
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9b54158d783b557913060f75c9c159d9
https://doi.org/10.3720/japt.61.287
https://doi.org/10.3720/japt.61.287
Autor:
Ryo Mimura
Publikováno v:
RESOURCES PROCESSING. 43:68-75
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::71188a47238ad1c612f0846cf35e7117
https://doi.org/10.4144/rpsj1986.43.68
https://doi.org/10.4144/rpsj1986.43.68
Autor:
Brent Gila, Bill R. Appleton, Joel Fridmann, Paul Mazarov, Jason E. Sanabia, S. Bauerdick, Lars Bruchhaus, Ryo Mimura, Ralf Jede, Floyd D. McDaniel, Barney L. Doyle
Publikováno v:
AIP Conference Proceedings.
The University of Florida (UF) have collaborated with Raith to develop a version of the Raith ionLiNE IBL system that has the capability to deliver multi‐ion species in addition to the Ga ions normally available. The UF system is currently equipped
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::95de88f297d898c719d40d42e0182bf8
https://doi.org/10.1063/1.3586096
https://doi.org/10.1063/1.3586096
Autor:
Ryo Mimura
Publikováno v:
RESOURCES PROCESSING. 39:167-177
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e075ed85957072570b0081abfa9f93cb
https://doi.org/10.4144/rpsj1986.39.167
https://doi.org/10.4144/rpsj1986.39.167
Publikováno v:
Japanese Journal of Applied Physics. 27:L2037
Distribution profiles and annealing characteristics of defects in GaAs induced by various (0.1–150 keV) energy Ga-focused ion-beam (FIB) irradiation were measured by means of deep-level transient spectroscopy and C-V carrier profiling to reveal the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8ea389bb6376e40993e35376061f0edb
https://doi.org/10.1143/jjap.27.l2037
https://doi.org/10.1143/jjap.27.l2037