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pro vyhledávání: '"Ryan de Ridder"'
Autor:
Omid Ghadami, Hongyu Lu, Matthew Chan, Mila Tan, Saeromi Chung, Sang Heon Lee, Matthew T. Holden, Ryan de Ridder, Barry Merriman, Drew A. Hall
Publikováno v:
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).