Investigation and modeling of impact ionization with regard to the RF and noise behavior of HFET.

Autor: Ruter, Ralf, Agethen, Michael

Publikováno v: IEEE Transactions on Microwave Theory & Techniques. Jun97, Vol. 45 Issue 6, p977. 7p. 6 Black and White Photographs, 3 Diagrams, 1 Chart, 14 Graphs.