Zobrazeno 1 - 10
of 25
pro vyhledávání: '"Ruskell, Todd"'
Autor:
Ruskell, Todd Gary, 1969
The capabilities of a commercially available atomic force microscope system have been expanded to include sub-picoampere measurements of local surface conductivity. This multiple mode analysis tool is capable of providing local I/V curves, current ma
Externí odkaz:
http://hdl.handle.net/10150/282152
Autor:
Ruskell, Todd G., Moreland, John
Publikováno v:
Journal of Applied Physics; 7/1/1999, Vol. 86 Issue 1, p664, 7p, 1 Black and White Photograph, 4 Diagrams, 1 Chart, 5 Graphs
Autor:
Kowalski, Frank V., Kowalski, Susan E., Colling, Thomas J., Cuba, J. V. Gutierrez, Gardner, Tracy Q., Greivel, Gus, Palou, Enrique, Ruskell, Todd
Publikováno v:
Impact of Pen & Touch Technology on Education; 2015, p307-314, 8p
Autor:
Kowalski, Frank V., Kowalski, Susan E., Colling, Thomas J., Cuba, J. V. Gutierrez, Gardner, Tracy Q., Greivel, Gus, Palou, Enrique, Ruskell, Todd
Publikováno v:
Impact of Pen & Touch Technology on Education; 2015, p297-305, 9p
Publikováno v:
AIP Conference Proceedings; Jan2013, Vol. 1513 Issue 1, p374-377, 4p, 3 Charts, 1 Graph
Publikováno v:
AIP Conference Proceedings; 10/20/2008, Vol. 1064 Issue 1, p135-138, 4p, 1 Black and White Photograph, 1 Chart, 1 Graph
Driven nonlinear atomic force microscopy cantilevers: From noncontact to tapping modes of operation.
Publikováno v:
Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1996, Vol. 14 Issue 2, p864-867, 4p
Publikováno v:
Physics Teacher; Jan2010, Vol. 48 Issue 1, p39-41, 3p
Publikováno v:
Israel Journal of Chemistry; 1996, Vol. 36 Issue: 1 p55-58, 4p