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pro vyhledávání: '"Runbing Hua"'
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 69:2642-2650
This article demonstrates an inaudible attack on smart speakers using electromagnetic interference (EMI). The EMI induces voltages on the order of a few millivolts on conductors, which are then converted into baseband signals by exploiting the inhere
Publikováno v:
2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium.
In this paper, a behavior modeling method of a buck converter with adaptive voltage positioning (AVP) and PCB parasitics for power distribution network design (PDN) is introduced. The behavior model of voltage regulator module (VRM) is previously pro
Autor:
Runbing Hua, Hideki Shumiya, David Pommerenke, Zhekun Peng, Kenji Araki, Omid Hoseini, Dong-Hyun Kim, Shota Konno
Publikováno v:
2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI).
An electrostatic discharge (ESD) happening on a commercial electronic device such as at the USB interface can induce soft-failure in the IC and disturb the normal operation of the device. This paper investigates the soft-failure behaviors of 14 comme
Autor:
Wei Zhang, Andrew Huang, Lucas Chuang, Runbing Hua, David Pommerenke, Hank Lin, Abhishek Patnaik, Bin-Chyi Tseng
Publikováno v:
IEEE Transactions on Electromagnetic Compatibility. 60:1263-1269
A system such as a human-assisting robot consists of many subsystems such as sensors, display, motors, and control. When an electrostatic discharge (ESD) occurs, it can disrupt the normal operation of any subsystem. This paper analyzes such events be
Publikováno v:
2018 IEEE International Conference on Computational Electromagnetics (ICCEM).
A complex system such as a human assisting robot will have many sensors and use parallel processing for achieving the desired action. During a transient disturbance, such as an electrostatic discharge (ESD), one or many of these sensors can be distur
Publikováno v:
2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
Currents induced on an I/O of a human wearable device IC are predicted using a test IC as a wearable device capable of transient event detection and level sensing. ESD on this pseudo wearable device using the test IC is characterized for different te