Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Ruifei Xiang"'
Autor:
Takashi Shiozawa, Koji Nagahiro, Parhat Ahmet, Hiroshi Iwai, Kuniyuki Kakushima, Yasutoshi Okuno, Ruifei Xiang, Kazuo Tsutsui, Michikazu Matsumoto, Masafumi Kubota
Publikováno v:
Microelectronic Engineering. 85:315-319
The annealing conditions causing an irregular peak in sheet resistance of nickel silicides are investigated. It is found that the irregular rise in sheet resistance occurs at a critical temperature of 750-775^oC as a result of agglomeration related t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b660ba08ec4a9d0d0a0c28d21590974d
http://t2r2.star.titech.ac.jp/cgi-bin/publicationinfo.cgi?q_publication_content_number=CTT100560055
http://t2r2.star.titech.ac.jp/cgi-bin/publicationinfo.cgi?q_publication_content_number=CTT100560055
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 568:416-420
The compound semiconductor InSb is a promising substrate for photon detectors due to its smallest band gap energy among developed semiconductors, its high atomic numbers and its high density. In spite of these advantages, no other research groups are
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::57455bb99896c35795d513a23e71a56d
https://doi.org/10.1016/j.nima.2006.06.009
https://doi.org/10.1016/j.nima.2006.06.009
Publikováno v:
IEEE Transactions on Nuclear Science. 52:3172-3175
Using an undoped InSb Schottky detector, the energy spectra of the gamma rays of /sup 241/Am and /sup 133/Ba were measured. For the measurements of X-rays and gamma rays with better energy resolution and higher efficiency than conventional semiconduc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c4f89cae20fd94c7a3fb340e71dfaba0
https://doi.org/10.1109/tns.2006.869817
https://doi.org/10.1109/tns.2006.869817
Autor:
K. Tsutsui, null Ruifei Xiang, K. Nagahiro, T. Shiozawa, P. Ahmet, Y. Okuno, M. Matsumoto, M. Kubota, K. Kakushima, H. Iwai
Publikováno v:
2006 International Workshop on Junction Technology.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e8bea739caf2d3dac87cf5114112cbba
https://doi.org/10.1109/iwjt.2006.1669476
https://doi.org/10.1109/iwjt.2006.1669476
Autor:
Takashi Shiozawa, Parhat Ahmet, Kuniyuki Kakushima, Koji Nagahiro, Kazuo Tsutsui, Hiroshi Iwai, Michikazu Matsumoto, Yasutoshi Okuno, Ruifei Xiang, Masafumi Kubota
Publikováno v:
2006 International Workshop on Junction Technology.
NiSi is a promising material on salicide process. However, the thermal stability of NiSi is still a significant problem. Degradation in sheet resistance of Ni silicide is originated from phase transition from NiSi to NiSi 2 and/or agglomeration of th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6069b3fcf362a37bafa513a00f26e53c
https://doi.org/10.1109/iwjt.2006.220889
https://doi.org/10.1109/iwjt.2006.220889
Publikováno v:
REVIEW OF SCIENTIFIC INSTRUMENTS. 76(2)
Gamma rays of Am[241] were measured by a Schottky type undoped InSbdetector at 4.2K. Although a photopeak was not observed, the signals of gamma rays were clearly separated from noises.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::361d5aba4d6f92894b5a3aad4009d7b3
http://hdl.handle.net/2433/4613
http://hdl.handle.net/2433/4613
Autor:
Tsutsui, K., Ruifei Xiang, Nagahiro, K., Shiozawa, T., Ahmet, P., Okuno, Y., Matsumoto, M., Kubota, M., Kakushima, K., Iwai, H.
Publikováno v:
2006 International Workshop on Junction Technology; 2006, p188-191, 4p
Autor:
Hishiki, Shigeomi, Kanno, Ikuo, Sugiura, Osamu, Xiang, Ruifei, Nakamura, Tatsuya, Katagiri, Masaki
Publikováno v:
IEEE Transactions on Nuclear Science; Dec2005 Part 2, Vol. 52 Issue 6, p3172-3175, 4p, 2 Diagrams, 2 Charts, 5 Graphs
Autor:
Kanno, Ikuo, Hishiki, Shigeomi, Sugiura, Osamu, Xiang, Ruifei, Nakamura, Tatsuya, Katagiri, Masaki
Publikováno v:
Review of Scientific Instruments; Feb2005, Vol. 76 Issue 2, p023102, 3p