Zobrazeno 1 - 10
of 16
pro vyhledávání: '"Rudzinski, Maciej"'
Autor:
Wylie, Mark, Hutchinson, Trent, Pan, Gang, Vavul, Thomas, Miller, John, Dayal, Aditya, Hess, Carl, Green, Mike, Hedges, Shad, Chalom, Dan, Rudzinski, Maciej, Wood, Craig, McMurran, Jeff
Publikováno v:
Proceedings of SPIE; Nov2009 Part 3, Issue 1, p74881O-74881O-7, 7p
Autor:
Shieh, W. B., Chou, William, Yang, Chuen-Huei, Wu, J. K., Chen, Noah, Yen, Shih M., Hsu, Tony, Tuan, Steve, Chang, Doris, Rudzinski, Maciej W., Wang, Lantian, Son, Kong
Publikováno v:
Proceedings of SPIE; Nov2004, Issue 1, p1047-1058, 12p
Autor:
Zurbrick, Larry S., Rudzinski, Maciej W., Stokowski, Stanley E., He, Long, Kimmel, Kurt R., Kashwala, Nishrin
Publikováno v:
Proceedings of SPIE; Nov2003, Issue 1, p107-112, 6p
Extending TeraStar reticle inspection capability to the 90nm node through layer-specific algorithms.
Publikováno v:
Proceedings of SPIE; Nov2003, Issue 1, p98-106, 9p
Publikováno v:
Proceedings of SPIE; Nov2003, Issue 1, p1174-1180, 7p
Autor:
Zurbrick, Larry S., Heumann, Jan P., Rudzinski, Maciej W., Stokowski, Stanley E., Urbach, Jan-Peter, Wang, Lantian
Publikováno v:
Proceedings of SPIE; Nov2002, Issue 1, p138-144, 7p
Autor:
Zurbrick, Larry S., Heumann, Jan P., Rudzinski, Maciej W., Stokowski, Stanley E., Urbach, Jan-Peter, Wang, Lantian
Publikováno v:
Proceedings of SPIE; Nov2002, Issue 1, p511-516, 6p
Autor:
Zurbrick, Larry S., Rudzinski, Maciej W., Stokowski, Stanley E., He, Long, Kimmel, Kurt R., Kashwala, Nishrin
Publikováno v:
Proceedings of SPIE; Nov2002, Issue 1, p241-246, 6p
Autor:
Zurbrick, Larry S., Emery, David, Rudzinski, Maciej W., Wihl, Mark J., Prudhomme, Michel, Crell, Christian, Griesinger, Uwe A., Vorwerk, Manuel, Hennig, Mario
Publikováno v:
Proceedings of SPIE; Nov2001, Issue 1, p170-174, 5p
Autor:
Pettibone, Donald W., Ananth, Mohan, Rudzinski, Maciej W., Watson, Sterling G., Zurbrick, Larry S., Liu, Hua-Yu, Karklin, Linard
Publikováno v:
Proceedings of SPIE; Nov1999, Issue 1, p711-720, 10p