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pro vyhledávání: '"Rudrajit Dutta"'
Autor:
Edward Brazil, Janusz Rajski, Srikanth Venkataraman, Rudrajit Dutta, Anja Fast, Peter Maxwell, Will Howell, A. Glowatz, Friedrich Hapke
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 40:584-597
This article describes a defect-oriented test (DOT) approach, which enables a complete physical defect-based automatic test pattern generation (ATPG) for the digital logic area of CMOS-based designs. Total critical area (TCA)-based methods are presen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::914235117db8d663555c539dcadb0c91
https://doi.org/10.1109/tcad.2020.3001259
https://doi.org/10.1109/tcad.2020.3001259
