Zobrazeno 1 - 10
of 134
pro vyhledávání: '"Ruault, M.O."'
Autor:
Chauvin, N., Henry, S., Flocard, H., Fortuna, F., Kaitasov, O., Pariset, P., Pellegrino, S., Ruault, M.O., Serruys, Y., Trocelier, P.
Publikováno v:
In Nuclear Inst. and Methods in Physics Research, B August 2007 261(1-2):34-39
Publikováno v:
In Journal of Nuclear Materials 1 December 2004 335(3):311-321
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2003, 206, pp.912-915
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2003, 206, pp.912-915
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::be5210469c8a2e31ea74225ceb5ace65
http://hal.in2p3.fr/in2p3-00022247
http://hal.in2p3.fr/in2p3-00022247
Publikováno v:
Applied Physics Letters
Applied Physics Letters, American Institute of Physics, 2002, 81, pp.2617-2619
Applied Physics Letters, American Institute of Physics, 2002, 81, pp.2617-2619
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::2dbc816ce627ab02525c3d0636db47cb
http://hal.in2p3.fr/in2p3-00011971
http://hal.in2p3.fr/in2p3-00011971
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2001, 184, pp.383-390
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2001, 184, pp.383-390
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::a3896ca004d2f3c15aaab90f7b137a0f
http://hal.in2p3.fr/in2p3-00019704
http://hal.in2p3.fr/in2p3-00019704
Publikováno v:
Semiconductors
Semiconductors, 2001, 35, pp.1182-1186
Semiconductors, 2001, 35, pp.1182-1186
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::c38337f453e7aad011f0e0e4b6c7e50b
http://hal.in2p3.fr/in2p3-00010708
http://hal.in2p3.fr/in2p3-00010708
Autor:
Zhu, X.F., Williams, J.S., Conway, M.J., Ridgway, M.C., Fortuna, F., Ruault, M.O., Bernas, H.
Publikováno v:
Applied Physics Letters
Applied Physics Letters, American Institute of Physics, 2001, 79, pp.3416-3418
Applied Physics Letters, American Institute of Physics, 2001, 79, pp.3416-3418
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::5fda1b8b67b08e294fe0e653c9a0b1c9
http://hal.in2p3.fr/in2p3-00010709
http://hal.in2p3.fr/in2p3-00010709
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Nuclear Instruments and Methods in Physics Research B
Materials Science with Ion Beams E-MRS 2000 Spring Meeting Symposium R.
Materials Science with Ion Beams E-MRS 2000 Spring Meeting Symposium R., May 2000, Strasbourg, France. pp.327-330
Nuclear Instruments and Methods in Physics Research B
Materials Science with Ion Beams E-MRS 2000 Spring Meeting Symposium R.
Materials Science with Ion Beams E-MRS 2000 Spring Meeting Symposium R., May 2000, Strasbourg, France. pp.327-330
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::4aeb5aa2d67f151916c2fbca0d9d9f15
http://hal.in2p3.fr/in2p3-00010361
http://hal.in2p3.fr/in2p3-00010361
Preferential amorphization and defect annihilation at nanocavities in silicon during ion irradiation
Autor:
Williams, J.S., Xianfang, Zhu, Ridgway, M.C., Conway, M.J., Williams, B.C., Fortuna, F., Ruault, M.O., Bernas, H.
Publikováno v:
Applied Physics Letters
Applied Physics Letters, American Institute of Physics, 2000, 77, pp.4280-4282
Applied Physics Letters, American Institute of Physics, 2000, 77, pp.4280-4282
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::6a398f5608db12cd42a6439fda79e4ec
http://hal.in2p3.fr/in2p3-00008398
http://hal.in2p3.fr/in2p3-00008398
Publikováno v:
Microscopy of Semiconducting Materials
Royal Microscopical Society Conference
Royal Microscopical Society Conference, Apr 1997, Bristol, United Kingdom. pp.501-506
Royal Microscopical Society Conference
Royal Microscopical Society Conference, Apr 1997, Bristol, United Kingdom. pp.501-506
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::d87312662fec622b364bc8bb01394695
http://hal.in2p3.fr/in2p3-00001811
http://hal.in2p3.fr/in2p3-00001811