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pro vyhledávání: '"Royston Tan"'
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 31:385-394
As integrated circuits (ICs) are rapidly migrating to smaller feature sizes, copper hillocks growing vertically from the copper back-end interconnects may cause inter layer metallic shorts and reliability issues. Uncovering the impact of design facto
Autor:
Adeline H. Basil, Chee-Hoe Ng, Sharon Philomena O'Neill, Fengwei Yu, Royston Tan, Kah-Leong Lim, Kian-Leong Goh, Liting Hang, Xiao-Dong Zhang
Publikováno v:
Neurobiology of Aging.
Despite intensive research, the etiology of Parkinson's disease (PD) remains poorly understood and the disease remains incurable. However, compelling evidence gathered over decades of research strongly support a role for mitochondrial dysfunction in