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pro vyhledávání: '"Roy P. Cuoco"'
Autor:
Harold P. Hjalmarson, Jason D. Serrano, Matthew J. Marinella, Don Hanson, Roy P. Cuoco, J. Kyle McDonald, David Russell Hughart, Michael Lee McLain, E. Fredrick Hartman
Publikováno v:
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
The effects of temperature on the total ionizing dose (TID) response of tantalum oxide (TaO x ) memristive bit cells are investigated. The TaO x devices were manufactured by Sandia National Laboratories (SNL). In-situ data were obtained as a function
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ab9ed8a423eabea1d1d3bbb97345c9a0
https://doi.org/10.1109/radecs.2017.8696164
https://doi.org/10.1109/radecs.2017.8696164
