Zobrazeno 1 - 10
of 18
pro vyhledávání: '"Rossano Carta"'
Autor:
Luca Maresca, Giuseppe De Caro, Gianpaolo Romano, Michele Riccio, Giovanni Breglio, Andrea Irace, Laura Bellemo, Rossano Carta, Nabil El Baradai
Publikováno v:
Energies, Vol 11, Iss 4, p 832 (2018)
Silicon power diodes are used to design different types of electrical energy systems. Their performance has been improved substantially, as a result of a concentrated research efforts that have taken place in the last two decades. They are considered
Externí odkaz:
https://doaj.org/article/a503b02489b94f23a88349595a07fe43
High Voltage Temperature Humidity Bias Test (THB-HV) is currently the state of the art test method for reliability evaluation of power devices in high humidity environments at high voltage. These conditions have become especially significant in the c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::510006da47f58e64589e8c89a4a6f97e
http://hdl.handle.net/11583/2738315
http://hdl.handle.net/11583/2738315
Autor:
Luciano Scaltrito, Davide Cimmino, G. Richieri, Rossano Carta, Roberta Busca, Sergio Ferrero, Candido Pirri
Publikováno v:
Journal of Vacuum Science & Technology B. 38:022206
Automotive requirements are becoming ever more severe in terms of device operation under high stress and in harsh working conditions. In this context, passivation layers play a fundamental role in determining electrical performance and reliability. T
Autor:
Rossano Carta, Andrea Irace, Nabil El Baradai, Giuseppe De Caro, G. Romano, Giovanni Breglio, Laura Bellemo, Michele Riccio, Luca Maresca
Publikováno v:
Energies; Volume 11; Issue 4; Pages: 832
Energies, Vol 11, Iss 4, p 832 (2018)
Energies, Vol 11, Iss 4, p 832 (2018)
Silicon power diodes are used to design different types of electrical energy systems. Their performance has been improved substantially, as a result of a concentrated research efforts that have taken place in the last two decades. They are considered
Autor:
MARESCA, LUCA, RICCIO, MICHELE, BREGLIO, GIOVANNI, IRACE, ANDREA, Carmelo, Sanfilippo, Filippo, Crudelini, El Baradai, Nabil, Rossano, Carta, Luigi, Merlin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3730::10f9cb1406ac385f87c8ce1d627cf9da
http://hdl.handle.net/11588/651493
http://hdl.handle.net/11588/651493
Autor:
I. Para, Rossano Carta, Michele Riccio, Laura Bellemo, N. El Baradai, Andrea Irace, N. Di Santo, P. Mirone, Giovanni Breglio, Luca Maresca, M. Naretto
In this paper the Electrostatic Discharge (ESD) capability of 200 V Fast Recovery Epitaxial Diodes (FREDs) is analysed by means of suitable experiments, TCAD simulations and theoretical analyses. Different doping profiles are investigated in order to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::54e53503b43f462d8715fc198fc6f67e
http://hdl.handle.net/11588/649217
http://hdl.handle.net/11588/649217
Autor:
Vincenzo d'Alessandro, Rossano Carta, Andrea Irace, Luigi Merlin, Diego Raffo, Giovanni Breglio, A. Bricconi, Paolo Spirito
Publikováno v:
Materials Science Forum. :1151-1154
The electrothermal behavior of 4H-SiC 600 V Schottky diodes operated in forward mode is analyzed through numerical and analytically-based simulations. It is shown that the unexpected occurrence of voltage surges systematically detected in state-of-th
Autor:
Mauro Furno, Rossano Carta, Federica Cappelluti, Luigi Merlin, Laura Bellemo, Giovanni Ghione, Fabrizio Bonani, C. Bocchiola
Publikováno v:
Microelectronics Journal. 37:190-196
The paper presents the results of the application of physics-based mixed-mode simulations to the analysis and optimization of the reverse recovery for Si-based fast recovery diodes (FREDs) using Platinum (Pt) lifetime killing. The trap model paramete
Autor:
Rossano Carta, Luigi Merlin, Filippo Crudelini, G. Romano, D. Cavaiuolo, Andrea Irace, D. Dapra, Giovanni Breglio, G. De Falco, Carmelo Sanfilippo, Michele Riccio
Publikováno v:
2014 International Symposium on Power Electronics, Electrical Drives, Automation and Motion.
With the increasing interest in electro-thermal simulation of multi-cellular IGBT structure, the use of PSpice device compact models becomes very attractive because they ensure a good trade-off between accuracy and speed. However, the evaluation of m
Autor:
IRACE, ANDREA, d'ALESSANDRO, VINCENZO, BREGLIO, GIOVANNI, SPIRITO, PAOLO, Andrea Bricconi, Rossano Carta, Diego Raffo, Luigi Merlin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b201b99f95a9cdb396fe6a7d80ccdbff
https://doi.org/10.4028/0-87849-425-1.1151
https://doi.org/10.4028/0-87849-425-1.1151