True Random Number Generator Based on the Variability of the High Resistance State of RRAMs

Autor: Maryam Akbari, Sattar Mirzakuchaki, Daniel Arumi, Salvador Manich, Alvaro Gomez-Pau, Francesca Campabadal, Mireia Bargallo Gonzalez, Rosa Rodriguez-Montanes

Publikováno v: IEEE Access, Vol 11, Pp 66682-66693 (2023)

Hardware-based security primitives like True Random Number Generators (TRNG) have become a crucial part in protecting data over communication channels. With the growth of internet and cloud storage, TRNGs are required in numerous cryptographic operat

Externí odkaz: https://doaj.org/article/e68dfd085a36443d89b4b8cde2add0a6

Serial RRAM Cell for Secure Bit Concealing

Autor: Alvaro Gomez-Pau, Rosa Rodriguez-Montanes, Binbin Yang, Liang Fang, Mireia Bargallo Gonzalez, Francesca Campabadal, Salvador Manich, D. Arumi

Publikováno v: Electronics
Volume 10
Issue 15
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Electronics, Vol 10, Iss 1842, p 1842 (2021)

Non-volatile memory cells are exposed to adversary attacks since any active countermeasure is useless when the device is powered off. In this context, this work proposes the association of two serial RRAM devices as a basic cell to store sensitive da

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d6bc937ed2bf5c5cc280d87d181455d7

Impact of Laser Attacks on the Switching Behavior of RRAM Devices

Autor: Alvaro Gomez-Pau, Rosa Rodriguez-Montanes, D. Arumi, Francesca Campabadal, Víctor Montilla, Salvador Manich, Mireia Bargallo Gonzalez, David Hernández

Publikováno v: Electronics, Vol 9, Iss 1, p 200 (2020)
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
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Electronics
Volume 9
Issue 1

The ubiquitous use of critical and private data in electronic format requires reliable and secure embedded systems for IoT devices. In this context, RRAMs (Resistive Random Access Memories) arises as a promising alternative to replace current memory

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::efa7155eb899ca376e5ade99e925d199
https://www.mdpi.com/2079-9292/9/1/200

Prebond Testing of Weak Defects in TSVs

Autor: Rosa Rodriguez-Montanes, D. Arumi, Joan Figueras

Publikováno v: UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
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Through-silicon vias (TSVs) are critical elements in 3-D integrated circuits susceptible to defects during fabrication and lifetime. It is desirable to detect defective TSVs in the early steps of the fabrication process to prevent stacking yield loss

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cfe5336aa711676bf4e2fd61088d98f1
https://doi.org/10.1109/tvlsi.2015.2448594

The low area probing detector as a countermeasure against invasive attacks

Autor: Salvador Manich, Rosa Rodriguez-Montanes, Georg Sigl, Michael Weiner

Publikováno v: Recercat. Dipósit de la Recerca de Catalunya
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UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)

© 20xx IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting /republishing this material for advertising or promotional purposes, creating new

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::efd6f3d93ba3484427374fbb8c083d3a
https://publica.fraunhofer.de/handle/publica/253387