Zobrazeno 1 - 10
of 55
pro vyhledávání: '"Ronsisvalle, C"'
Autor:
Abbate, C., Iannuzzo, F., Busatto, G., Sanseverino, A., Velardi, F., Ronsisvalle, C., Victory, J.
Publikováno v:
In Microelectronics Reliability September-October 2014 54(9-10):1927-1934
Publikováno v:
In Microelectronics Reliability September-November 2013 53(9-11):1707-1712
Autor:
Ronsisvalle, C., Enea, V.
Publikováno v:
In Microelectronics Reliability 2010 50(9):1773-1777
Publikováno v:
In Microelectronics Journal June 2008 39(6):890-898
Publikováno v:
Scopus-Elsevier
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::18fb8cd813820e3825dcdfb543f2b732
http://hdl.handle.net/11580/13944
http://hdl.handle.net/11580/13944
Autor:
Ciocci, F, DELLA VALLE, Federico, Doria, A, Gallerano, G. P., Giannessi, L, Giovenale, E, Hauser, P, Kottmann, F, Messina, G, Milotti, Edoardo, Petitjean, C, Picardi, L, Renieri, A, Rizzo, C, Ronsisvalle, C, Simons, L. M., Taqqu, D, Vacchi, A, Vignati, A, Zavattini, E.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::6a5a6c80f6ec5e5035dc5ff844a52257
http://hdl.handle.net/11365/1035119
http://hdl.handle.net/11365/1035119
Autor:
SALVATORE MUSUMECI, Pagano, R., Raciti, A., Buonomo, S., Enea, V., Gullotta, G., Ronsisvalle, C.
Publikováno v:
Scopus-Elsevier
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::f9a25cbe91dd8aef2df6664bcc84855f
http://hdl.handle.net/20.500.11769/81380
http://hdl.handle.net/20.500.11769/81380