Zobrazeno 1 - 10
of 280
pro vyhledávání: '"Ronchi test"'
Autor:
Malenko, A. S.1 omalenko@ukr.net, Borovytsky, V. N.1
Publikováno v:
Semiconductor Physics, Quantum Electronics & Optoelectronics. 2016, Vol. 19 Issue 3, p311-314. 4p.
Autor:
Uhlén, Fredrik1 fredrik.uhlen@biox.kth.se, Rahomäki, Jussi1, Nilsson, Daniel1, Seiboth, Frank2, Sanz, Claude1, Wagner, Ulrich3, Rau, Christoph3,4,5, Schroer, Christian G.2, Vogt, Ulrich1
Publikováno v:
Journal of Synchrotron Radiation. Sep2014, Vol. 21 Issue 5, p1105-1109. 5p.
Autor:
S. Yaghoubi, S. Hossein1, Ebrahimi, Samira1, Dashtdar, Masoomeh1 m-dashtdar@sbu.ac.ir, Doblas, Ana2, Javidi, Bahram3
Publikováno v:
Applied Physics Letters. 5/6/2019, Vol. 114 Issue 18, pN.PAG-N.PAG. 5p. 1 Color Photograph, 1 Diagram, 3 Graphs.
Publikováno v:
Journal of Modern Optics. May2012, Vol. 59 Issue 8, p721-728. 8p.
Publikováno v:
Optics Communications. Jun2015, Vol. 344, p27-32. 6p.
Autor:
Granados-Agustín, Fermín Salomón1 fermin@inaoep.mx, Cardona-Núñez, Octavio1, Díaz-Uribe, Rufino2, Percino-Zacarías, Elizabeth1, Zárate-Rivera, Ana María1, Cornejo-Rodríguez, Alejandro1
Publikováno v:
Optik - International Journal for Light & Electron Optics. Jan2014, Vol. 125 Issue 2, p667-670. 4p.
Autor:
A.S. Malenko
Publikováno v:
Semiconductor Physics, Quantum Electronics & Optoelectronics, Vol 19, Iss 3, Pp 311-314 (2016)
Performed in this work is the analysis of the optical Ronchi interferometer circuit and its upgrading to test quality of various optical surfaces. Briefly described in this paper is the classic test by Ronchi, shown is every upgraded circuit diagram
Externí odkaz:
https://doaj.org/article/2cc61ab7a2764f3e8f334daca7cbff77
Akademický článek
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Autor:
John Rogers
Publikováno v:
Tribute to James C. Wyant: The Extraordinaire in Optical Metrology and Optics Education.
In a previous presentation, the author presented a method of tolerancing mid-frequency surface ripple, based on a sensitivity parameter that related the slope error on the surface to the ray deviation at the image plane. The method established an upp
Publikováno v:
Optics and Lasers in Engineering. 113:47-54
Since its proposal the Ronchi “ruling” test has been considered as the most remarkable technique of the Schlieren family. Despite being based on fringe pattern generation and commonly interpreted in a qualitative way, it was capable of achieving