Zobrazeno 1 - 10
of 47
pro vyhledávání: '"Ronald J. Warzoha"'
Autor:
Enrique D. Gomez, Zhe Chen, Tian Zhang, Seong H. Kim, Bing Zhang, Ziyu Liu, Wengchang Lu, Ronald J. Warzoha, Jerry Bernholc, Xin Chen, Qiyan Zhang, Qiming Zhang, Brian F. Donovan
Publikováno v:
Matter. 4:2448-2459
Summary Polymers with high dielectric breakdown strength (Eb) over a broad temperature range are vital for many applications. The presence of weak points, such as voids and free volume, severely limit the Eb of many high-temperature polymers. Here, w
Autor:
Ronald J. Warzoha
Publikováno v:
ASME 2022 Heat Transfer Summer Conference.
Theremoreflectance techniques that utilize a fiber-based probe have obvious advantages for characterizing the thermal properties of liquids and biological materials. For instance, an all-fiber thermoreflectance system would allow for its integration
Autor:
Edward P. Gorzkowski, Ashutosh Giri, Tyler Cosby, Ronald J. Warzoha, Adam A. Wilson, Andrew J. Borgdorff, Nicholas T. Vu, Eric A. Patterson, Brian F. Donovan
Publikováno v:
Macromolecules. 53:11089-11097
Thin-film (5–20 μm) polymer dielectrics are a critical component in high energy density capacitors. Understanding thermal transport in these materials is critical to addressing thermally enabled di...
Autor:
Brian F. Donovan, Ronald J. Warzoha
Publikováno v:
Physical review letters. 128(12)
Publikováno v:
Journal of Electronic Packaging. 143
Publikováno v:
International Journal of Heat and Mass Transfer. 130:874-881
Interfaces play a critical role in heat dissipation for electronics packaging applications, thermoelectric energy conversion, data center cooling and renewable energy systems architectures. They are particularly influential as device length scales ar
Publikováno v:
Review of Scientific Instruments. 93:084904
Time delayed pump–probe measurement techniques, such as Time Domain Thermoreflectance (TDTR), have opened up a wealth of opportunities for metrology at ultra-fast timescales and nanometer length scales. For nanoscale thermal transport measurements,
Autor:
Ronald J. Warzoha
Publikováno v:
Journal of Electronic Packaging. 143
Autor:
Adam A. Wilson, Samuel Graham, Ronald J. Warzoha, Patrick E. Hopkins, Darshan G. Pahinkar, Zhiting Tian, Brian F. Donovan, Sukwon Choi, Laura B. Ruppalt, Nazli Donmezer, Ashutosh Giri, Jingjing Shi
Publikováno v:
Journal of Electronic Packaging. 143
This review introduces relevant nanoscale thermal transport processes that impact thermal abatement in power electronics applications. Specifically, we highlight the importance of nanoscale thermal transport mechanisms at each layer in material hiera
Publikováno v:
2020 19th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm).
Thermal resistance arises at the interface of two different materials. However, developers of sensors, electronics, and power conversion devices often ignore this effect. The additional thermal resistance imposed due to interface can enhance sensitiv