Zobrazeno 1 - 1
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pro vyhledávání: '"Ronald C. Geiger"'
Autor:
Louis V. Medina, John A. Williamson, Ronald C. Geiger, Ernesto Shiling, Jiun-Hsin Liao, R. P. Robertazzi, Garry Moore
Publikováno v:
ITC
Continuing scaling trends in semiconductor technology, as well as the test requirements of new technologies being incorporated with mainstream silicon integrated circuits, has increased the complexity of parametric and defect structure testing. New t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2e7f72264be438346cacdb66c8af1baf
https://doi.org/10.1109/test.2010.5699201
https://doi.org/10.1109/test.2010.5699201
