Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Ronald Anthony Zeszut"'
Publikováno v:
ECS Meeting Abstracts. :778-778
The scanning Kelvin probe (SKP) is a device that measures the difference in work function between a sample and probe tip on the instrument, and has proven to be a useful research tool over the past several decades. With this technique, the Volta pote
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4688402606ada666e41bf5a513b9a75e
https://doi.org/10.1149/ma2022-0213778mtgabs
https://doi.org/10.1149/ma2022-0213778mtgabs
Autor:
Ronald Anthony Zeszut, Uziel Landau
Publikováno v:
ECS Meeting Abstracts. :1260-1260
Not requiring an external current source, electroless deposition provides unique capability in laying down thin metallic layers on top of non-conductive substrates. This is particularly advantageous for the semiconductor industry, enabling the metall
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::31790f9f622a0fd93ceb6bbca9d9447b
https://doi.org/10.1149/ma2019-02/28/1260
https://doi.org/10.1149/ma2019-02/28/1260