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This paper presents a new approach to improve random test coverage during physical synthesis for high performance design. This new approach performs test point insertion (TPI) to improve testability of random resistant nets. Conventional test point i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c48333ebfb2c23d497022f6b56aff759
https://doi.org/10.1109/test.2009.5355747
https://doi.org/10.1109/test.2009.5355747
