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pro vyhledávání: '"Ron Kapusta"'
Autor:
Ron Kapusta
Publikováno v:
IEEE Solid-State Circuits Magazine. 10:112-115
Presents information on the 2018 Symposium on VLSI Technology and Circuits: Technology, Circuits, and Systems for Smart Living.
Autor:
Ron Kapusta
Publikováno v:
IEEE Solid-State Circuits Magazine. 9:136-140
Presents information on the 2017 Symposium on VLSI Circuits: Harmonious Integration Toward Next Dimensions.
Publikováno v:
IEEE Transactions on Circuits and Systems I: Regular Papers. 62:1707-1715
The conventional switched-capacitor amplifier faces design tradeoffs between settling accuracy and noise, in that high settling accuracy demands wide bandwidth but at the sacrifice of noise performance. In fact settling accuracy and noise exhibit dif
Autor:
Mark D. Maddox, Ned Guthrie, Michael C. W. Coln, Nikhil Mascarenhas, Ron Kapusta, Lalinda D. Fernando, Junhua Shen, Baozhen Chen, Akira Shikata
Publikováno v:
2017 Symposium on VLSI Circuits.
This paper presents a successive approximation register (SAR) analog-to-digital converter (ADC) that is much smaller and faster than other recently reported precision (16-bit and beyond) SAR ADCs. In addition, it features low input capacitance and an
Publikováno v:
ISSCC
A 14-bit SAR ADC is presented that achieves 73.6 dB SNDR at 80 MSPS while using a 1.2-V-only supply. In order to overcome throughput limitations common to conventional SAR ADCs, several techniques are proposed. First, a flash sub-ADC is utilized to r
Autor:
Michael C. W. Coln, Baozhen Chen, Mark D. Maddox, Lalinda D. Fernando, Junhua Shen, Ron Kapusta
Publikováno v:
A-SSCC
This paper presents a first reported passive-charge-sharing SAR ADC that achieves 16 bit linearity. It is known that on chip passive-charge-sharing suffers from poor linearity due to the unregulated reference voltage during bit trials. The proposed u
Autor:
Ron Kapusta
Publikováno v:
CICC
• Time-interleaved SAR ADCs are a major focus of active development • Power and area efficiency of SAR architecture suits itself very well to interleaving • Architecture scale well with advancing CMOS process — Process-limited FOM S (jitter)
Publikováno v:
CICC
Several circuit-level techniques are described which are used to reduce or cancel thermal noise and break the so-called kT/C limit. kT/C noise describes the total thermal noise power added to a signal when a sample is taken on a capacitor. In the fir
Autor:
Ron Kapusta, Eric Naviasky
Publikováno v:
CICC
This session on Nyquest rate data converters has 7 exciting papers exploring the ranges of low power pipeline converters, calibration of SAR converters, ultra high speed flash converters, and high speed low power interleaved SAR converters.